Zobrazeno 1 - 10
of 88
pro vyhledávání: '"Carlton G Willson"'
Autor:
Carlton G Willson, Christopher H. Chen, Ryan Deschner, Christopher W. Bielawski, Wontae Joo, Jonathan P. Moerdyk
Publikováno v:
Journal of Polymer Science Part A: Polymer Chemistry. 57:1791-1795
Publikováno v:
Microelectronic Engineering. 116:44-50
A strong adhesion force between resist and underlayer materials was employed to reduce resist pattern peeling generated from de-molding in step-and-flash imprint lithography (SFIL), while simultaneously minimizing the adhesion force between resist ma
Autor:
Raymond J. Phaneuf, W. Bell, Tsung-Cheng Lin, Gottlieb S. Oehrlein, Carlton G Willson, Robert L. Bruce, Brian K. Long
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:751-757
The authors have studied the influence of Si–O bonding in the polymer structure of Si-containing resists on O2 plasma etch behavior. Three polymers were synthesized with the same Si wt % (12.1%) and varying number of Si–O bonds (0, 1, or 2). The
Publikováno v:
Langmuir. 23:1166-1170
The effects of template surface composition on fluorinated surfactant segregation were investigated for imprint lithography with photopolymerizable vinyl ether formulations. Heptadecafluoro-1,1,2,2-tetrahydrodecyl vinyloxy-methyloxy dimethylsilane, c
Publikováno v:
Langmuir. 21:11795-11801
Substrate hydration is demonstrated to be crucial to film quality during self-assembled (SA) film deposition of tridecafluoro-1,1,2,2,-tetrahydrooctyltrichlorosilane (FOTS) from the vapor phase. The surface hydration was studied by thermogravimetric
Autor:
William J. Dauksher, D. J. Resnick, Kevin J. Nordquist, Todd Bailey, David P. Mancini, Carlton G Willson, S. Johnson, John G. Ekerdt, Sidlgata V. Sreenivasan
Publikováno v:
Microelectronic Engineering. 69:412-419
Step and flash imprint lithography (SFIL) is an attractive method for printing sub-100 nm geometries. Relative to other imprinting processes, SFIL has the advantage that the template is transparent, thereby facilitating conventional overlay technique
Autor:
David P. Mancini, Todd Bailey, Kevin J. Nordquist, K. Gehoski, John G. Ekerdt, Sidlgata V. Sreenivasan, Andy E. Hooper, Jeffrey H. Baker, L. Dues, William J. Dauksher, D. J. Resnick, S. Johnson, Carlton G Willson
Publikováno v:
Microelectronic Engineering. :221-228
Step and flash imprint lithography (SFIL) replicates patterns by using a transparent template with relief images etched into its surface. Recent work has examined alternative methods for template fabrication. One scheme incorporates a conductive and
Autor:
K. Gehoski, M. Meissl, William J. Dauksher, D. J. Resnick, Sidlgata V. Sreenivasan, Eric S. Ainley, Matthew E. Colburn, Jeffrey H. Baker, Byung Jin Choi, David P. Mancini, Kevin J. Nordquist, John G. Ekerdt, Todd Bailey, Carlton G Willson, A. Alec Talin, S. Johnson
Publikováno v:
Microelectronic Engineering. :461-467
Step and flash imprint lithography (SFIL) is an attractive method for printing sub-100 nm geometries. Relative to other imprinting processes, SFIL has the advantage that the template is transparent, thereby facilitating conventional overlay technique
Autor:
John G. Ekerdt, Sidlgata V. Sreenivasan, Carlton G Willson, Todd Bailey, S. Johnson, Douglas J. Resnick
Publikováno v:
Journal of Photopolymer Science and Technology. 15:481-486
The goal of the SFIL development program is to enable patterning of sub-100 nm features at room temperature and with minimal applied pressure. We believe the use of low viscosity materials and photopolymerization chemistry will enable SFIL to achieve
Publikováno v:
Chemistry of Materials. 11:2515-2519
The mechanism by which a tristable, laterally linked, SC* liquid crystal dimer reorients under the application of an electric field has been investigated by a combination of X-ray diffraction studies and torsional viscosity measurements. A new experi