Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Carlo Brzuska"'
Publikováno v:
Journal of Materials Chemistry A. 6:11496-11506
We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films. The thin films are prepared by vac
Autor:
Annemarie Pucci, Carlo Brzuska, Marcel Plogmeyer, Artem A. Bakulin, Roland Scheer, Christian Müller, Maxim S. Pshenichnikov, Robert Lovrincic, Wolfgang Kowalsky, Michael Sendner, Tobias Glaser, Sebastian Döring
Publikováno v:
Chemistry of Materials, 27(22), 7835-7841. AMER CHEMICAL SOC
While the susceptibility of CH3NH3PbI3 to water is well-documented, the influence of water on device performance is not well-understood. Herein, we use infrared spectroscopy to show that water infiltration into CH3NH3PbI3 occurs much faster and at a
Autor:
Carlo Brzuska, Marcus Gläser, Christian Hagendorf, Tommy Tänzer, Fabian Schippel, Stephan Großer
Publikováno v:
Energy Procedia. 55:451-455
Non-destructive methods for high-resolution inspection are of great importance for quality assurance, reliability assessment and for research and development. Especially for samples like solar modules or large specimens high-resolution microscopy mea
Autor:
Christian Müller, Tobias Glaser, Marcel Plogmeyer, Michael Sendner, Sebastian Döring, Artem A. Bakulin, Carlo Brzuska, Roland Scheer, Maxim S. Pshenichnikov, Wolfgang Kowalsky, Annemarie Pucci, Robert Lovrinčić
Publikováno v:
Chemistry of Materials; Nov2015, Vol. 27 Issue 22, p7835-7841, 7p
Publikováno v:
Energy Procedia. :569-575
Potential-induced degradation of the shunting type (PID-s) of silicon solar cells is attributed to planar defects at the cell front surface. Stacking fault crystal defects with a length of few micrometers penetrating the p-n junction cause shunts whe