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pro vyhledávání: '"Carleton S. Clauss"'
Autor:
Aaron R. Hawkins, Michael S. Johnson, M. D. Jack, Ken Kosai, George R. Chapman, Carleton S. Clauss, Joshua L. Beutler
Publikováno v:
Journal of Applied Physics. 101:023117
A study of the frequency response of solid-state impact ionization multipliers (SIMs) is presented that emphasizes the role of resistive and capacitive elements of the device to establish response limitations. SIMs are designed to amplify input curre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::355ff8a431590bf5802e18f23c9d8c3f
https://doi.org/10.1063/1.2426376
https://doi.org/10.1063/1.2426376
