Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Carl Salupo"'
Autor:
Lila Raj Dahal, Carl Salupo, Robert W. Collins, Andre S. Ferlauto, Nikolas J. Podraza, Zhiquan Huang
Publikováno v:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
A growth evolution diagram has been developed to guide plasma-enhanced chemical vapor deposition (PECVD) of n-type hydrogenated amorphous silicon (a-Si:H) and nanocrystalline silicon (nc-Si:H) for use as the n-layer component of p-i-n a-Si:H superstr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf5960f75a733dffbf80dd5a194adceb
https://doi.org/10.1109/pvsc.2013.6744490
https://doi.org/10.1109/pvsc.2013.6744490
Autor:
Nikolas J. Podraza, Dinesh Attygalle, Carl Salupo, Sylvain Marsillac, Zhiquan Huang, Robert W. Collins, Lila Raj Dahal
Publikováno v:
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2.
An understanding of the relationship between materials property and thin-film solar cell performance variations over large areas is of interest for evaluating the impact of macroscopic nonuniformities in scale-up from laboratory cells to production m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6301823238df66b2c7ffda0df6416076
https://doi.org/10.1109/pvsc-vol2.2013.6656734
https://doi.org/10.1109/pvsc-vol2.2013.6656734
Autor:
Jie Chen, Blaine D. Johs, Prakash Koirala, Robert W. Collins, Sylvain Marsillac, Jeffrey S. Hale, Carl Salupo, Kenneth R. Kormanyos, Galen L. Pfeiffer
Publikováno v:
2012 38th IEEE Photovoltaic Specialists Conference.
Through-the-glass spectroscopic ellipsometry (SE) has been applied in mapping analyses of 60 cm × 120 cm panels consisting of soda-lime glass coated with a four-layer transparent conducting oxide (TCO) stack and a two-layer CdS/CdTe photovoltaic (PV
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14b26816225ef5c94ad279e027a7a943
https://doi.org/10.1109/pvsc.2012.6317640
https://doi.org/10.1109/pvsc.2012.6317640
Autor:
Zhiquan Huang, Carl Salupo, Sylvain Marsillac, Lila Raj Dahal, Nikolas J. Podraza, Robert W. Collins
Publikováno v:
2011 37th IEEE Photovoltaic Specialists Conference.
Spectroscopic ellipsometry was applied to analyze the roll-to-roll deposition of thin film hydrogenated silicon (Si:H) n-i-p solar cells on back-reflector-coated flexible plastic substrates. Real time SE (RTSE) was used for probing along the substrat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::880e472454b5dbc74e1ce69d556edbc7
https://doi.org/10.1109/pvsc.2011.6185876
https://doi.org/10.1109/pvsc.2011.6185876
Autor:
C. Major, Carl Salupo, A. Nemeth, G. Juhasz, Béla Pécz, Puruswottam Aryal, Miklós Fried, O. Polgár, Zhiquan Huang, Peter Petrik, Dinesh Attygalle, Lila Raj Dahal, Robert W. Collins
Publikováno v:
MRS Proceedings. 1321
A prototype expanded-beam spectroscopic ellipsometer has been developed that uses uncollimated (non-parallel, diffuse) illumination with a detection system consisting of an angle-of-incidence-sensitive pinhole camera for high-speed, large-area imagin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ffa58ddf385f1f1935c27ba359a6aac
https://doi.org/10.1557/opl.2011.1115
https://doi.org/10.1557/opl.2011.1115
Autor:
Peter Petrik, Lila Raj Dahal, C. Major, Carl Salupo, G. Juhasz, A. Nemeth, O. Polgár, Robert W. Collins, Miklós Fried
Publikováno v:
MRS Proceedings. 1323
We have developed a prototype spectroscopic ellipsometer for imaging/mapping purposes requiring only one measurement cycle (one rotation period of a polarizer or analyzer) for the acquisition of a two-dimensional array of data points. Our new measure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c9919e02b3c6007b5b29c4a9250cc25
https://doi.org/10.1557/opl.2011.820
https://doi.org/10.1557/opl.2011.820
Autor:
Zhiquan Huang, Carl Salupo, Dinesh Attygalle, Lila Raj Dahal, Michelle N. Sestak, Puruswottam Aryal, Prakash Koirala, Robert W. Collins, Meghan R. Mapes
Publikováno v:
2010 35th IEEE Photovoltaic Specialists Conference.
Spectroscopic ellipsometry (SE) from the ultraviolet (UV) to mid-infrared (IR) has been applied to analyze thin film solar cell structures deposited on transparent conducting oxide (TCO) coated glass substrates. Two structures were studied here, chos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b2dcf6b2f27105d18746294dd5cd6c1
https://doi.org/10.1109/pvsc.2010.5616076
https://doi.org/10.1109/pvsc.2010.5616076
Autor:
Dinesh Attygalle, Sylvain Marsillac, Carl Salupo, Robert W. Collins, Zhiquan Huang, Lila Raj Dahal, Michelle N. Sestak
Publikováno v:
2010 35th IEEE Photovoltaic Specialists Conference.
Real time spectroscopic ellipsometry (RTSE) has been developed to monitor the cassette roll-to-roll deposition of thin film Si:H n-i-p solar cells on flexible polymer substrates coated with a back-reflector (BR). The methodology is first demonstrated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbb12581b8031ace04ed19cadb35c2db
https://doi.org/10.1109/pvsc.2010.5616856
https://doi.org/10.1109/pvsc.2010.5616856
Publikováno v:
MRS Proceedings. 622
We report preliminary electrical and diffusion barrier characteristics of Ti (100nm)/TaSi2 (200nm)/Pt (300nm) thermally stable ohmic contact metallization on n-type 6H-SiC epilayers. These contacts exhibited linear ohmic characteristics with contact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ce134bcad1ab381ea11e41b6e469a66
https://doi.org/10.1557/proc-622-t8.3.1
https://doi.org/10.1557/proc-622-t8.3.1
Publikováno v:
MRS Proceedings. 640
The growth kinetics of thermally stable Ti(100nm)/TaSi2 (200nm)/Pt (300nm) metallization on 6H-SiC was studied after heat treatment in air up to 700°C. Scanning electron microscopy (SEM) of the contact surface morphology reveals a two-dimensional ne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e5d54c3a10f98876f873b1049ba6d0a
https://doi.org/10.1557/proc-640-h7.5
https://doi.org/10.1557/proc-640-h7.5