Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Carl M. Szabo"'
Autor:
Alyson D. Topper, Melanie D. Berg, Jean-Marie Lauenstein, Jonathan A. Pellish, John W. Lewellen, Kenneth A. LaBel, Martha V. O'Bryan, Michael J. Campola, Edward J. Wyrwas, Carl M. Szabo, Dakai Chen, Edward P. Wilcox, Megan C. Casey, Michael A. Holloway
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::951c02e6a4a534118072c45c85b85ec8
https://doi.org/10.1109/nsrec.2018.8584264
https://doi.org/10.1109/nsrec.2018.8584264
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Testing of an Intel 14nm desktop processor was conducted under proton irradiation. We share lessons learned, demonstrating that complex devices beget further complex challenges requiring practical and theoretical investigative expertise to solve.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4ddafe3a0db9a5ade0293e1da1d72e4
https://doi.org/10.1109/radecs.2017.8696137
https://doi.org/10.1109/radecs.2017.8696137
Autor:
Austin H. Roach, Tammy J. Berger, Matthew J. Gadlage, Dobrin P. Bossev, Darin A. York, Adam R. Duncan, James D. Ingalls, Aaron M. Williams, Carl M. Szabo, Kenneth A. LaBel, Matthew J. Kay
Publikováno v:
International Symposium for Testing and Failure Analysis.
This work investigates the origin of the single event hard failures of an advanced commercial FinFET microprocessor induced by heavy ions using a combination of failure analysis tools. It focuses on elucidating the reason behind the hard and catastro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97f9880f0c70f003f4981bd2284c1a9c
https://doi.org/10.31399/asm.cp.istfa2016p0555
https://doi.org/10.31399/asm.cp.istfa2016p0555
Autor:
Carl M. Szabo, Casey H. Hedge, Austin H. Roach, Kenneth A. LaBel, Aaron M. Williams, James D. Ingalls, Adam R. Duncan, Matthew J. Gadlage, Matthew J. Kay, Dobrin P. Bossev
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
Heavy ion and proton test results on multiple commercial 14-nm Intel microprocessors are presented. Testing was performed using commercial motherboards with a mixture of commercial and custom software. Machine check errors, system crashes, graphical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67dc5018effd36383993f59b7005808d
https://doi.org/10.1109/nsrec.2016.7891738
https://doi.org/10.1109/nsrec.2016.7891738
Autor:
Carl M. Szabo, Jean-Marie Lauenstein, Kenneth A. LaBel, Stanley A. Ikpe, Dakai Chen, Jonathan A. Pellish, Megan C. Casey, Michael J. Campola, Raymond L. Ladbury, Melanie D. Berg, Edward P. Wilcox, Martha V. O'Bryan
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85641ba5d2fc28731d132b787ecb8aed
https://doi.org/10.1109/nsrec.2016.7891706
https://doi.org/10.1109/nsrec.2016.7891706
Autor:
Pat Bruner, Mike Krzesniak, Adam R. Duncan, Matt Kay, Carl M. Szabo, Lei Dong, Kenneth A. LaBel
Publikováno v:
2015 IEEE Radiation Effects Data Workshop (REDW).
Hardness assurance test results of Intel state-of-the-art 14nm "Broadwell" U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9c9e72b7f30003ba5c5519ec2c154a4
https://doi.org/10.1109/redw.2015.7336725
https://doi.org/10.1109/redw.2015.7336725
Autor:
Carl M. Szabo, Matthew J. Kay, Martin A. Carts, Adam R. Duncan, Robert A. Gigliuto, Matthew J. Gadlage, Dave Ingalls, Kenneth A. LaBel, Timothy Sinclair
Publikováno v:
2013 IEEE Radiation Effects Data Workshop (REDW).
Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial motherboards and software stress applications versus more traditional
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc66ed03aa8cd5a9f32896d781486863
https://doi.org/10.1109/redw.2013.6658198
https://doi.org/10.1109/redw.2013.6658198