Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Carina Stritt Philipp Schütz Jürgen Hofmann Alexander Flisch Urs Sennhauser"'
Scattering of high energetic X ray photons causes artifacts in industrial computed tomography (CT). In particular for MeV photons the interaction cross sections for scattering processes dominate those of the photoelectric effect. In addition electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=snsf_p3_pubs::e5c1f259ae67a20ee68032cdf2a00aef
http://www.ndt.net/events/ECNDT2014/app/content/Paper/256_Stritt.pdf
http://www.ndt.net/events/ECNDT2014/app/content/Paper/256_Stritt.pdf
