Zobrazeno 1 - 10
of 101
pro vyhledávání: '"Campbell, Deanna"'
Autor:
Wolfe, M. A., McJunkin, Thomas, Ward, Daniel R., Campbell, DeAnna, Friesen, Mark, Eriksson, M. A.
The challenges of operating qubits in a cryogenic environment point to a looming bottleneck for large-scale quantum processors, limited by the number of input-output connections. Classical processors solve this problem via multiplexing; however, on-c
Externí odkaz:
http://arxiv.org/abs/2410.13721
Autor:
Basso, Luca, Kehayias, Pauli, Henshaw, Jacob, Ziabari, Maziar Saleh, Byeon, Heejun, Lilly, Michael P., Bussmann, Ezra, Campbell, Deanna M., Misra, Shashank, Mounce, Andrew M.
The recently-developed ability to control phosphorous-doping of silicon at an atomic level using scanning tunneling microscopy (STM), a technique known as atomic-precision-advanced-manufacturing (APAM), has allowed us to tailor electronic devices wit
Externí odkaz:
http://arxiv.org/abs/2207.14254
Autor:
Halsey, Connor, Depoy, Jessica, Campbell, DeAnna M., Ward, Daniel R., Anderson, Evan M., Schmucker, Scott W., Ivie, Jeffrey A., Gao, Xujiao, Scrymgeour, David A., Misra, Shashank
As transistor features shrink beyond the 2 nm node, studying and designing for atomic scale effects become essential. Being able to combine conventional CMOS with new atomic scale fabrication routes capable of creating 2D patterns of highly doped pho
Externí odkaz:
http://arxiv.org/abs/2110.11580
Autor:
Ward, Daniel R., Schmucker, Scott W., Anderson, Evan M., Bussmann, Ezra, Tracy, Lisa, Lu, Tzu-Ming, Maurer, Leon N., Baczewski, Andrew, Campbell, Deanna M., Marshall, Michael T., Misra, Shashank
Publikováno v:
Electronic Device Failure Analysis, 22 (2020) 1:4-10
An exponential increase in the performance of silicon microelectronics and the demand to manufacture in great volumes has created an ecosystem that requires increasingly complex tools to fabricate and characterize the next generation of chips. Howeve
Externí odkaz:
http://arxiv.org/abs/2002.11003
Autor:
Anderson, Evan M., Campbell, DeAnna M., Maurer, Leon N., Baczewski, Andrew D., Marshall, Michael T., Lu, Tzu-Ming, Lu, Ping, Tracy, Lisa A., Schmucker, Scott W., Ward, Daniel R., Misra, Shashank
Atomic precision advanced manufacturing (APAM) offers creation of donor devices in an atomically thin layer doped beyond the solid solubility limit, enabling unique device physics. This presents an opportunity to use APAM as a pathfinding platform to
Externí odkaz:
http://arxiv.org/abs/2002.09075
Autor:
Campbell, Deanna Ing
Community colleges are increasingly accountable for student outcomes and have been focused on closing outcome gaps among groups of students. Nevertheless, Native American students have continued to be among the lowest performing ethnic groups. Yet th
Externí odkaz:
http://pqdtopen.proquest.com/#viewpdf?dispub=10160160
Autor:
Ward, Daniel R., Marshall, Michael T., Campbell, DeAnna M., Lu, Tzu-Ming, Koepke, Justin C., Scrymgeour, David A., Bussmann, Ezra, Misra, Shashank
We describe an all-optical lithography process that can be used to make electrical contact to atomic-precision donor devices made in silicon using scanning tunneling microscopy (STM). This is accomplished by implementing a cleaning procedure in the S
Externí odkaz:
http://arxiv.org/abs/1708.05411
Autor:
Campbell, Deanna.
Publikováno v:
ProQuest Full Text.
Thesis (M.A.)--Carleton University, 2008.
Includes bibliographical references (p. 166-179). Also available in electronic format on the Internet.
Includes bibliographical references (p. 166-179). Also available in electronic format on the Internet.
Akademický článek
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Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p