Development of Metrology of X-ray Optics at the ALS

Autor: Yashchuk, V.V., Cambie, R., Celestre, R.S., Church, M.N., Heimann, P., Glossinger, J.M., Goldberg, K.A., Gullikson, E.M., Kirschman, J.L., MacDowell, A.A., McKinney, W.R., Morrison, G.Y., Padmore, H.A., Voronov, D.L., Warwick, T.

Publikováno v: Yashchuk, V.V.; Cambie, R.; Celestre, R.S.; Church, M.N.; Heimann, P.; Glossinger, J.M.; et al.(2008). Development of Metrology of X-ray Optics at the ALS. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/4x28h706

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::1399efbeb0e2e3a1e6eeead00bc4645c
http://www.escholarship.org/uc/item/4x28h706

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