Zobrazeno 1 - 10
of 514
pro vyhledávání: '"Calderon, HA"'
Autor:
Mantilla Á; Instituto Politécnico Nacional, Laboratorio de Fotocatálisis, CICATA-Legaria Legaria 694, Col. Irrigación 11500 Mexico City Mexico., Guerrero-Araque D; CONAHCyT-Universidad Autónoma Metropolitana, Departamento de Química Av. San Rafael Atlixco 156 09340 Mexico City Mexico dianacga@msn.com., Sierra-Uribe JH; Universidad Autónoma Metropolitana, Departamento de Química Av. San Rafael Atlixco 156 09340 Mexico City Mexico., Lartundo-Rojas L; Instituto Politécnico Nacional, Centro de Nanociencias y Micro y Nanotecnología, Zacatenco Mexico City Mexico., Gómez R; Universidad Autónoma Metropolitana, Departamento de Química Av. San Rafael Atlixco 156 09340 Mexico City Mexico., Calderon HA; Instituto Politécnico Nacional, ESFM, Departamento de Física, UPALM Miguel Othon de Mendizabal s/n 07320 Mexico City Mexico., Zanella R; Instituto de Ciencias Aplicadas y Tecnología, Universidad Nacional Autónoma de México, Ciudad Universitaria Circuito Exterior S/N, Coyoacan 04510 Mexico City Mexico., Ramírez-Ortega D; Instituto Politécnico Nacional, Laboratorio de Fotocatálisis, CICATA-Legaria Legaria 694, Col. Irrigación 11500 Mexico City Mexico.; Instituto Politécnico Nacional-ENCB Edificio 8, Av. Luis Enrique Erro S/N, UPALM 07738 Mexico City Mexico divadql@gmail.com.
Publikováno v:
RSC advances [RSC Adv] 2024 Aug 19; Vol. 14 (36), pp. 26259-26271. Date of Electronic Publication: 2024 Aug 19 (Print Publication: 2024).
Autor:
Tang W; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, United States.; Tianjin University, School of Chemical Engineering and Technology, State Key Laboratory of Chemical Engineering, The Co-Innovation Center of Chemistry and Chemical Engineering of Tianjin, Tianjin, China., Robles FC; University of Houston, Mechanical Engineering Technology, Houston, TX, United States., Kisielowski C; The Molecular Foundry, LBNL, One Cyclotron Rd., Berkeley, CA, United States., Calderon HA; Instituto Politecnico Nacional, ESFM, Dto. Física, UPALM Zacatenco, CDMX, Mexico., Rimmer JD; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, United States.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 1807-1809.
Autor:
Calderon HA; Instituto Politécnico Nacional, Dept. Física ESFM-IPN, Zacatenco CDMX, México., Fan Z; Department of Mechanical Engineering Technology, University of Houston, Houston, TX, United States., Samprash R; Department of Mechanical Engineering Technology, University of Houston, Houston, TX, United States., Robles Hernandez FC; Department of Mechanical Engineering Technology, University of Houston, Houston, TX, United States.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 119-120.
Autor:
Romero-Ortiz G; Universidad Autonoma Metropolitana, CDMX, Mexico., Samaniego-Benitez E; CONACYT- Instituto Politecnico Nacional, CDMX, Mexico., Tzompantzi F; Instituto Politecnico Nacional, CICATA Legaria, CDMX, Mexico., Mantilla A; Instituto Politecnico Nacional, CICATA Legaria, CDMX, Mexico., Garibay-Febles V; Instituto Mexicano del Petroleo, CDMX, Mexico., Calderon HA; Instituto Politecnico Nacional, ESFM, Depto. Física, Mexico CDMX, Mexico.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 1975-1977.
Autor:
Castañeda BN; ESFM-IPN, UPALM Zacatenco Mexico, CDMXMexico., Calderon HA; ESFM-IPN, UPALM Zacatenco Mexico, CDMXMexico., Martinez H; CNNMT-IPN, UPALM Zacatenco Mexico, CDMXMexico.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 2028-2031.
Autor:
Calderon HA; Instituto Politecnico Nacional, ESFM, UPALM Ed 9, Mexico CDMX, Mexico., Ramirez-Ortega D; Instituto Politecnico Nacional, CICATA, CDMX, Mexico., Arenque DG; CONACYT-UAM, Depto. Química, Av. San Rafael Atlixco 156, Mexico CDMX, México., Gomez R; UAM, Depto. Química, Av. San Rafael Atlixco 156, Mexico CDMX, Mexico., Zanella R; Instituto de Ciencias Aplicadas y Tecnología, UNAM, Ciudad Universitaria, Mexico.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2023 Jul 22; Vol. 29 (Supplement_1), pp. 1342-1344.
Autor:
Tang W; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, 77204, USA.; Tianjin University, School of Chemical Engineering and Technology, State Key Laboratory of Chemical Engineering, The Co-Innovation Center of Chemistry and Chemical Engineering of Tianjin, Tianjin, 300072, China., Yang T; Stockholm University, Department of Materials and Environmental Chemistry, SE-106 91, Stockholm, Sweden., Morales-Rivera CA; University of Pittsburgh, Chemical and Petroleum Engineering, Pittsburgh, PA, 15261, USA., Geng X; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, 77204, USA., Srirambhatla VK; EPSRC Future Manufacturing Research Hub for Continuous and Manufacturing and Advanced Crystallization (CMAC), University of Strathclyde, Technology and Innovation Centre, 99 George Street, Glasgow, G1 1RD, Scotland, UK.; Strathclyde Institute of Pharmaceutical and Biomedical Sciences, University of Strathclyde, Glasgow, G4 0RE, Scotland, UK., Kang X; Tianjin University, School of Chemical Engineering and Technology, State Key Laboratory of Chemical Engineering, The Co-Innovation Center of Chemistry and Chemical Engineering of Tianjin, Tianjin, 300072, China., Chauhan VP; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, 77204, USA., Hong S; University of Pittsburgh, Chemical and Petroleum Engineering, Pittsburgh, PA, 15261, USA., Tu Q; Texas A&M University, Materials Science & Engineering, College Station, TX, 77843, USA., Florence AJ; EPSRC Future Manufacturing Research Hub for Continuous and Manufacturing and Advanced Crystallization (CMAC), University of Strathclyde, Technology and Innovation Centre, 99 George Street, Glasgow, G1 1RD, Scotland, UK.; Strathclyde Institute of Pharmaceutical and Biomedical Sciences, University of Strathclyde, Glasgow, G4 0RE, Scotland, UK., Mo H; Purdue University, Medicinal Chemistry and Molecular Pharmacology, College of Pharmacy, West Lafayette, IN, 47097, USA., Calderon HA; Instituto Politecnico Nacional, ESFM-IPN, Departamento de Fı́sica, UPALM Zacatenco, Mexico City, CDMX 07338, Mexico.; The Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley, CA, 94720, USA., Kisielowski C; The Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley, CA, 94720, USA., Hernandez FCR; University of Houston, Mechanical Engineering Technology, Houston, TX, 77204, USA., Zou X; Stockholm University, Department of Materials and Environmental Chemistry, SE-106 91, Stockholm, Sweden., Mpourmpakis G; University of Pittsburgh, Chemical and Petroleum Engineering, Pittsburgh, PA, 15261, USA., Rimer JD; University of Houston, Chemical and Biomolecular Engineering, Houston, TX, 77204, USA. jrimer@central.uh.edu.
Publikováno v:
Nature communications [Nat Commun] 2023 Feb 02; Vol. 14 (1), pp. 561. Date of Electronic Publication: 2023 Feb 02.
Publikováno v:
Ultramicroscopy
Kisielowski, C; Calderon, HA; Chen, FR; Helveg, S; Jinschek, JR; Specht, P; et al.(2017). Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016. Ultramicroscopy, 179, 108-112. doi: 10.1016/j.ultramic.2017.04.002. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/7343x9cq
Kisielowski, C; Calderon, HA; Chen, FR; Helveg, S; Jinschek, JR; Specht, P; et al.(2017). Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016. Ultramicroscopy, 179, 108-112. doi: 10.1016/j.ultramic.2017.04.002. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/7343x9cq
Autor:
Chen T; National Center for International Research on Photoelectric and Energy Materials, School of Materials and Energy, Yunnan University, Kunming, 650091, P. R. China., Wang C; National Center for International Research on Photoelectric and Energy Materials, School of Materials and Energy, Yunnan University, Kunming, 650091, P. R. China., Xing X; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA.; Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, P. R. China., Qin Z; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA.; Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, P. R. China., Qin F; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA., Wang Y; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA., Alam MK; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA., Hadjiev VG; Department of Mechanical Engineering, University of Houston, Houston, TX, 77204, USA.; Texas Center for Superconductivity, University of Houston, Houston, TX, 77204, USA., Yang G; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA., Ye S; National Center for International Research on Photoelectric and Energy Materials, School of Materials and Energy, Yunnan University, Kunming, 650091, P. R. China., Yang J; National Center for International Research on Photoelectric and Energy Materials, School of Materials and Energy, Yunnan University, Kunming, 650091, P. R. China., Wang R; National Center for International Research on Photoelectric and Energy Materials, School of Materials and Energy, Yunnan University, Kunming, 650091, P. R. China., Yue S; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA.; Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, P. R. China., Zhang D; School of Materials Engineering, Purdue University, West Lafayette, IN, 47907, USA., Shang Z; School of Materials Engineering, Purdue University, West Lafayette, IN, 47907, USA., Robles-Hernandez FC; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA.; Mechanical Engineering Technology, University of Houston, Houston, TX, 77204, USA., Calderon HA; Instituto Politecnico Nacional, ESFM-IPN, UPALM, Departamento de Física, Mexico CDMX, 07338, Mexico., Wang H; School of Materials Engineering, Purdue University, West Lafayette, IN, 47907, USA., Wang Z; Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, P. R. China., Bao J; Department of Electrical and Computer Engineering, University of Houston, Houston, TX, 77204, USA.; Texas Center for Superconductivity, University of Houston, Houston, TX, 77204, USA.
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany) [Small] 2022 Mar; Vol. 18 (11), pp. e2105009. Date of Electronic Publication: 2022 Jan 20.
Publikováno v:
Microscopy and Microanalysis, vol 23, iss S1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3cdcf41e9bfb4c45286f49389ba3853a
https://escholarship.org/uc/item/0mb1v7d2
https://escholarship.org/uc/item/0mb1v7d2