Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Caitlin A. Chapin"'
Autor:
Caitlin A. Chapin, Anand Vikas Lalwani, Savannah R. Eisner, Debbie G. Senesky, Hannah S. Alpert, Ananth Saran Yalamarthy, Maximillian Holliday
Publikováno v:
IEEE Sensors Journal. 22:1245-1251
Autor:
Caitlin A. Chapin, Udo Ausserlechner, Debbie G. Senesky, Kenneth E. Goodson, Helmut Kock, Karen M. Dowling, Tanya Liu, Hannah S. Alpert, Savannah R. Eisner, Peter F. Satterthwaite, Ananth Saran Yalamarthy, Mehdi Asheghi
Publikováno v:
Journal of Microelectromechanical Systems. 29:669-676
This article presents GaN two-dimensional electron gas (2DEG) Hall plates with low residual offset and noise at 3 V input bias. We studied devices made from three consecutive fabrication generations through current spinning offset measurements in a z
Autor:
Kaoru Porter, Simon S. Ang, Ruiqi Chen, Debbie G. Senesky, Ardalan Nasiri, Caitlin A. Chapin, Tom Cannon, Errol V. Porter
Publikováno v:
Journal of Microelectronics and Electronic Packaging. 17:59-66
An electronic packaging technology that survives the simulated Venusian surface temperature of 465°C and 96 bar pressure in carbon dioxide (CO2) and nitrogen environments, without the corrosive trace gases, was developed. Alumina ceramic substrates
Autor:
Caitlin A. Chapin, Helmut Kock, Udo Ausserlechner, Ananth Saran Yalamarthy, Hannah S. Alpert, Savannah R. Benbrook, Karen M. Dowling, Debbie G. Senesky
Publikováno v:
IEEE Sensors Journal. 19:3640-3646
The effect of metal contact lengths on current- and voltage-scaled sensitivities and magnetic field offsets of octagonal AlGaN/GaN and InAlN/GaN Hall-effect sensors were examined in this work. The calculations that take into account the shape of the
Autor:
Caitlin A. Chapin, Debbie G. Senesky, Saleh Kargarrazi, Ananth Saran Yalamarthy, Peter F. Satterthwaite, Scott William Blankenberg
Publikováno v:
IEEE Journal of the Electron Devices Society. 7:931-935
Extreme environments such as the Venus atmosphere are among the emerging applications that demand electronics that can withstand high-temperature oxidizing conditions. While wide-bandgap technologies for integrated electronics have been developed so
Autor:
Hannah S. Alpert, Sara Port, Peter F. Satterthwaite, Simon S. Ang, Ardalan Nasiri, Debbie G. Senesky, Caitlin A. Chapin, Ananth Saran Yalamarthy, Savannah R. Eisner
Publikováno v:
2021 IEEE Aerospace Conference (50100).
Further development of harsh environment electronics capable of uncooled operation under Venus surface atmospheric conditions (~460°C, ~92 bar, corrosive) would enable future missions to the surface of Venus to operate for up to a year. Wide band-ga
Publikováno v:
Journal of Applied Physics. 131:155701
The electrical and structural characteristics of 50-nm-thick zinc oxide (ZnO) metal-semiconductor-metal ultraviolet (UV) photodetectors subjected to proton irradiation at different temperatures are reported and compared. The devices were irradiated w
Autor:
Jiya Janowitz, Sai Kumar, Brandon Yeung, Debbie G. Senesky, Ricardo Peterson, Hannah S. Alpert, Karen M. Dowling, Caitlin A. Chapin, Jhorge Lopez, Max Holliday
Publikováno v:
2020 IEEE SENSORS.
Every transformer has a core that produces a powerful AC magnetic field while in operation, which can be measured to monitor the health and performance of the transformer in real time. However, the environment inside of a bucket transformer presents
Autor:
Caitlin A. Chapin, Debbie G. Senesky, Ricardo Peterson, Srabanti Chowdhury, Mohamadali Malakoutian, Xiaoqing Xu
Publikováno v:
Physical Review B. 102
Here we present an analysis of the mobility-limiting mechanisms of a two-dimensional hole gas on hydrogen-terminated diamond surfaces. The scattering rates of surface impurities, surface roughness, non-polar optical phonons, and acoustic phonons are
Publikováno v:
Sensors and Actuators A: Physical. 263:216-223
A micro-scale pressure sensor leveraging a ring-shaped In0.17Al0.83N/GaN high electron mobility transistor (HEMT) sensing element was fabricated and characterized under applied pressure. The device design uses InAlN/GaN-on-Si as the material platform