Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Caio F.S. Cruz"'
Autor:
Myke D.M. Valadao, Diego A. Amoedo, Gustavo M. Torres, Edma V.C.U. Mattos, Antonio M.C. Pereira, Matheus S. Uchoa, Lucas M. Torres, Victor L.G. Cavalcante, Jose E.B.S. Linhares, Mateus O. Silva, Agemilson P. Silva, Caio F.S. Cruz, S.F. Romulo, Ruan J.S. Belem, Thiago B. Bezerra, Waldir S.S. Junior, Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Max S. Santos, Nilo E.M. Silva, Andrey R.R. Bessa, Andrew M. Santos, Adriel V. Santos, Diego A. Amoedo, Edma V.C.U. Mattos, Antonio M.C. Pereira, Valney M.N., Gustavo M. Torres, Agemilson P. Silva, Caio F.S. Cruz, Romulo S.F., Ruan J.S. Belem, Thiago B. Bezerra, Waldir S.S., Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Mateus O. Silva, Myke D.M. Valadao, Victor L.G. Cavalcante, Adriel V. Santos, Gustavo M. Torres, Edma V.C.U. Mattos, Antonio M.C. Pereira, Matheus S. Uchoa, Lucas M. Torres, Jose E.B.S. Linhares, Nilo E.M. Silva, Agemilson P. Silva, Caio F.S. Cruz, S.F. Romulo, Ruan J.S. Belem, Thiago B. Bezerra, S.S. Waldir, Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Mateus O. Silva, Gustavo M. Torres, Myke D.M. Valadao, Edma V.C.U. Mattos, Antonio M.C. Pereira, Matheus S. Uchoa, Lucas M. Torres, Valney M. N., Victor L.G. Cavalcante, Jose E.B.S. Linhares, Adriel V. Santos, Agemilson P. Silva, Caio F.S. Cruz, Romulo S. F., Ruan J.S. Belem, Lucas Fujita, Felipe A.A. Araujo, Carlos A. Monteiro, Thiago B. Bezerra, Waldir S. S., Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Andrey R.R. Bessa, Max S. Santos, Jose E.B.S. Linhares, Myke D.M. Valadao, Diego A. Amoedo, Edma V.C.U. Mattos, Antonio M.C. Pereira, Lucas M. Torres, M.N. Valney, Andrew M. Santos, Agemilson P. Silva, Caio F.S. Cruz, S.F. Romulo, Ruan J.S. Belem, Thiago B. Bezerra, S.S. Waldir, Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Nilo E.M. Silva, Diego A. Amoedo, Matheus S. Uchoa, Max S. Santos, Andrey R.R. Bessa, Edma V.C.U. Mattos, Antonio M.C. Pereira, Valney M.N., Andrew M. Santos, Agemilson P. Silva, Caio F.S. Cruz, Romulo S.F., Ruan J.S. Belem, Rodrigo S. Lima, Isabella A. Cabral, Sandy F. Nascimento, Thiago B. Bezerra, Waldir S.S. Junior, Celso B. Carvalho
Publikováno v:
2022 IEEE International Conference on Consumer Electronics - Taiwan.
Autor:
Eulanda M. Santos, Caio F.S. Cruz, Alexandre M. Uchoa, Andre S. Costa, Lucas G.C. Evangelista, Ruan J.S. Belem, Agemilson Pimentel, Anderson S. Jesus, Osmar A. da Silva, Rafael Giusti, Luciana R. Costa
Publikováno v:
ICCE-TW
We investigate using signal detection techniques for testing the audio capability of television sets in an industrial production line with the objective of identifying defectives devices. Two approaches were investigated in this study: the first was
Autor:
Mateus O. Da Silva, Caio F.S. Cruz, Agemilson P. Silva, Ruan J.S. Belem, Lucas G.C. Evangelista, Waldir S. S. Junior, Luiz C. S. Garcia Junior, Thiago Brito Bezerra, Edma V.C. Urtiga Mattos, David Alan de Oliveira Ferreira, Ricardo G. Paula, Gustavo M. Torres, Kethilen Y. Ouchi, Wilson C. C. Junior, Andre S. Costa, Adriana S. Souza, Antonio M.C. Pereira, Myke D. M. Valadao, Celso B. Carvalho, Victor L. G. Cavalcante
Publikováno v:
ICCE
Mura on LCD displays are challenging visual defects to detect, due to uneven brightness of the panel. So, automatic detection of mura defects on TVs and monitors is an important application to ensure the quality of LCDs manufactured in electronic pro
Autor:
Luciana R. Costa, Caio F.S. Cruz, Celso B. Carvalho, Mateus O. Da Silva, Ruan J.S. Belem, Agemilson P. Silva, Edma V.C. Urtiga Mattos, Wilson C. C. Junior, Antonio M.C. Pereira, Ricardo G. Paula, Waldir S. S. Junior, Victor L. G. Cavalcante, Anderson S. Jesus, Kethilen Y. Ouchi, Thiago Brito Bezerra, David Alan de Oliveira Ferreira, Gustavo M. Torres
Publikováno v:
ICCE
Bright pixel defect occurs in LCDs when a transistor of a subpixel remains bright. Bright pixels reduce the quality of manufactured devices, negatively impacting companies looking to meet an increasingly demanding market. In this wokr, conducted by t
Autor:
Caio F.S. Cruz, Eddie Filho, Lucas Coimbra, Ricardo G. Paula, Ruan J.S. Belem, Anderson S. Jesus, Osmar R.A. Silva, André Lucirton Costa, Wilson Salgado Júnior, Agemilson Pimentel
Publikováno v:
ICCE-TW
In production lines for monitors and displays, some validation tests are based on visual inspection, whose preliminary step usually consists in detecting the area corresponding to a monitor's screen, which is then followed by evaluation procedures. N