New measurement method to investigated service life of protection networks exposed to ESD

Autor: Ruffat, F., Caignet, F., Boyer, A., Escudié, F., Mejecaze, G., Puybaret, F.

Publikováno v: In Microelectronics Reliability November 2022 138

Impact of non-linear capacitances on transient waveforms during system level ESD stress

Autor: Escudié, F., Caignet, F., Nolhier, N., Bafleur, M.

Publikováno v: In Microelectronics Reliability September 2016 64:88-92

Reliability of ESD protection devices designed in a 3D technology

Autor: Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.

Publikováno v: In Microelectronics Reliability September-October 2014 54(9-10):2272-2277

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation

Autor: Monnereau, N., Caignet, F., Trémouilles, D., Nolhier, N., Bafleur, M.

Publikováno v: In Microelectronics Reliability February 2013 53(2):221-228

The impacts of EMC/ESD on embedded systems: a challenge for safe systems achievement

Autor: CAIGNET, F., Duchamp, Geneviève

Publikováno v: Proceedings of ESREF 2017
Proceedings of ESREF 2017, 2017, Bordeaux, France
Proceedings od ERSERF 2017
Proceedings od ERSERF 2017, 2017, Bordeaux, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f8597db09dc511d563f6761a52f1bd24
https://hal.archives-ouvertes.fr/hal-01719890