Femtosecond temperature measurements of laser-shocked copper deduced from the intensity of the x-ray thermal diffuse scattering

Autor: Wark, J. S., Peake, D. J., Stevens, T., Heighway, P. G., Ping, Y., Sterne, P., Albertazzi, B., Ali, S. J., Antonelli, L., Armstrong, M. R., Baehtz, C., Ball, O. B., Banerjee, S., Belonoshko, A. B., Bolme, C. A., Bouffetier, V., Briggs, R., Buakor, K., Butcher, T., Cafiso, S. Di Dio, Cerantola, V., Chantel, J., Di Cicco, A., Coleman, A. L., Collier, J., Collins, G., Comley, A. J., Coppari, F., Cowan, T. E., Cristoforetti, G., Cynn, H., Descamps, A., Dorchies, F., Duff, M. J., Dwivedi, A., Edwards, C., Eggert, J. H., Errandonea, D., Fiquet, G., Galtier, E., Garcia, A. Laso, Ginestet, H., Gizzi, L., Gleason, A., Goede, S., Gonzalez, J. M., Gorman, M. G., Harmand, M., Hartley, N., Hernandez-Gomez, C., Higginbotham, A., Höppner, H., Humphries, O. S., Husband, R. J., Hutchinson, T. M., Hwang, H., Keen, D. A., Kim, J., Koester, P., Konopkova, Z., Kraus, D., Krygier, A., Labate, L., Lazicki, A. E., Lee, Y., Liermann, H-P., Mason, P., Masruri, M., Massani, B., McBride, E. E., McGuire, C., McHardy, J. D., McGonegle, D., McWilliams, R. S., Merkel, S., Morard, G., Nagler, B., Nakatsutsumi, M., Nguyen-Cong, K., Norton, A-M., Oleynik, I. I., Otzen, C., Ozaki, N., Pandolfi, S., Pelka, A., Pereira, K. A., Phillips, J. P., Prescher, C., Preston, T., Randolph, L., Ranjan, D., Ravasio, A., Redmer, R., Rips, J., Santamaria-Perez, D., Savage, D. J., Schoelmerich, M., Schwinkendorf, J-P., Singh, S., Smith, J., Smith, R. F., Sollier, A., Spear, J., Spindloe, C., Stevenson, M., Strohm, C., Suer, T-A., Tang, M., Toncian, M., Toncian, T., Tracy, S. J., Trapananti, A., Tschentscher, T., Tyldesley, M., Vennari, C. E., Vinci, T., Vogel, S. C., Volz, T. J., Vorberger, J., Willman, J. T., Wollenweber, L., Zastrau, U., Brambrink, E., Appel, K., McMahon, M. I.

We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures above 135~GPa. We hence deduce the x-ray Debye-Waller (DW) factor, providi

Externí odkaz: http://arxiv.org/abs/2501.02940