Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Cadix, O."'
Autor:
Decams, J.M., Guillon, H., Jiménez, C., Audier, M., Sénateur, J.P., Dubourdieu, C., Cadix, O., O’Sullivan, B.J., Modreanu, M., Hurley, P.K., Rusworth, S., Leedham, T.J., Davies, H., Fang, Q., Boyd, I.
Publikováno v:
In Microelectronics Reliability 2005 45(5):929-932
Autor:
Decams, J.M., Guillon, H., Jiménez, Carmen, Audier, Marc, Sénateur, J.P., Dubourdieu, Catherine, Cadix, O., O'Sullivan, B.J., Mondreanu, M., Hurley, P.K., Rushworth, S., Leedham, T.J., Davies, H., Fang, Q., Boyd, I.
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2005, 45, pp.929
Microelectronics Reliability, Elsevier, 2005, 45, pp.929
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d4452cff6512ac63fe647ba958e0cc6e
https://hal.archives-ouvertes.fr/hal-00135043
https://hal.archives-ouvertes.fr/hal-00135043
Autor:
Decams, J.M.1, Guillon, H.1, Jiménez, C.2, Audier, M.2, Sénateur, J.P.2, Dubourdieu, C.2, Cadix, O.3, O’Sullivan, B.J.3, Modreanu, M.3, Hurley, P.K.3, Rusworth, S.4, Leedham, T.J.4, Davies, H.4, Fang, Q.5, Boyd, I.5
Publikováno v:
Microelectronics Reliability. May2005, Vol. 45 Issue 5/6, p929-932. 4p.