Zobrazeno 1 - 10
of 167
pro vyhledávání: '"Cabral Jr., C."'
Publikováno v:
In Thin Solid Films 2001 397(1):194-202
Publikováno v:
Journal of Applied Physics; 8/1/2003, Vol. 94 Issue 3, p1605, 12p, 4 Black and White Photographs, 6 Charts, 2 Graphs
Autor:
Saenger, K.L., Cabral Jr., C.
Publikováno v:
Journal of Applied Physics; 12/1/1999, Vol. 86 Issue 11, p6084, 4p, 2 Charts, 5 Graphs
Autor:
Harper, J. M. E., Cabral Jr., C.
Publikováno v:
Journal of Applied Physics; 9/1/1999, Vol. 86 Issue 5, p2516, 10p, 1 Black and White Photograph, 3 Diagrams, 4 Graphs
Autor:
Clevenger, L.A., Arcot, B., Ziegler, W., Colgan, E. G., Hong, Q. Z., d'Heurle, F. M., Cabral, Jr., C., Gallo, T. A., Harper, J. M. E.
Publikováno v:
Journal of Applied Physics; 1/1/1998, Vol. 83 Issue 1, p90, 10p, 4 Black and White Photographs, 2 Charts, 8 Graphs
Publikováno v:
Archivos de Zootecnia, Volume: 58, Issue: 223, Pages: 395-404, Published: SEP 2009
Objetivou-se com este trabalho caracterizar a microflora epífita da cana-de-açúcar (C), da gliricídia fresca (GNE) e emurchecida (GE) e das misturas ensiladas. Este estudo foi desenvolvido na Universidade Federal de Alagoas, UFAL, de janeiro a de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______624::53e8f1fe6d3cd5b6558470e6e5ea609c
http://scielo.isciii.es/scielo.php?script=sci_arttext&pid=S0004-05922009000300008&lng=en&tlng=en
http://scielo.isciii.es/scielo.php?script=sci_arttext&pid=S0004-05922009000300008&lng=en&tlng=en
Autor:
Guillorn, M., Chang, J., Pyzyna, A., Engelmann, S., Joseph, E., Fletcher, B., Cabral Jr., C., Lin, C.-H., Bryant, A., Darnon, Maxime, Ott, J., Lavoie, C., Frank, M., Gignac, L., Newbury, J., Wang, Chen, Klaus, D., Kratschmer, E., Bucchignano, J., To, B., Graham, W., Lauer, I., Sikorski, E., Carter, S., Narayanan, V., Fuller, N., Zhang, Y., Haensch, W.
Publikováno v:
Proceeding of 2009 International Electron Devices Meeting, IEDM 2009
Proceeding of 2009 International Electron Devices Meeting, IEDM 2009, Dec 2009, San Francisco, United States
Proceeding of 2009 International Electron Devices Meeting, IEDM 2009, Dec 2009, San Francisco, United States
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::04aa1a2ecf29dcee08cbf8bb1928f8a8
https://hal.archives-ouvertes.fr/hal-00625310
https://hal.archives-ouvertes.fr/hal-00625310
Autor:
Fried, D.M., Hergenrother, J.M., Topol, A.W., Chang, L., Sekaric, L., Sleight, J.W., McNab, S.J., Newbury, J., Steen, S.E., Gibson, G., Zhang, Y., Fuller, N.C.M., Bucchignano, J., Lavoie, C., Cabral Jr, C., Canaperi, D., Dokumaci, O., Frank, D.J., Duch, E.A., Babich, I.
Publikováno v:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p261-264, 4p
Publikováno v:
IBM Journal of Research & Development. May-Jul98, Vol. 42 Issue 3/4, p501. 8p. 3 Black and White Photographs, 1 Diagram, 1 Chart, 7 Graphs.
Autor:
HARPER, J. M. E., CABRAL JR, C., LAVOIE, C., CLEVENGER, L. A., d'HEURLE, F. M., GIGNAC, L., JORDAN-SWEET, J., ROY, R. A., SAENGER, K. L., MILES, G. L., MANN, R. W., NAKOS, J.
Publikováno v:
Silicides: Fundamentals & Applications; 2000, p261-275, 15p