Optical Study and Experimental Realization of Nanostructured Back Reflectors with Reduced Parasitic Losses for Silicon Thin Film Solar Cells.

Autor: Li Z; NOVITAS (Centre of Micro-/Nano-electronics), Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore. lize0004@ntu.edu.sg.; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. lize0004@ntu.edu.sg., E R; NOVITAS (Centre of Micro-/Nano-electronics), Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore. erusli@e.ntu.edu.sg., Lu C; NOVITAS (Centre of Micro-/Nano-electronics), Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore. CLU010@e.ntu.edu.sg., Prakoso AB; NOVITAS (Centre of Micro-/Nano-electronics), Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore. ABPRAKOSO@ntu.edu.sg., Foldyna M; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. martin.foldyna@polytechnique.edu., Khoury R; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. rasha.khoury@polytechnique.edu., Bulkin P; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. pavel.bulkin@polytechnique.edu., Wang J; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. junkang.wang@polytechnique.edu., Chen W; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. wanghua.chen@polytechnique.edu., Johnson E; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. erik.johnson@polytechnique.edu., Cabarrocas PIR; LPICM (Laboratory of Physics of Interfaces and Thin Films), CNRS (Centre national de la recherche scientifique), Ecole Polytechnique, Université Paris Saclay, Palaiseau 91128, France. pere.roca@polytechnique.edu.

Publikováno v: Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2018 Aug 18; Vol. 8 (8). Date of Electronic Publication: 2018 Aug 18.