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Autor:
C.L. Lin, Jerry M. Woodall, R.C. Gee, C.W. Seabury, John A. Higgins, P.J. Kirchner, C.W. FarIey, B.T. McDermott
Publikováno v:
51st Annual Device Research Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24e3389400be3455a7bcc085d8f5c045
https://doi.org/10.1109/drc.1993.1009594
https://doi.org/10.1109/drc.1993.1009594
