Zobrazeno 1 - 10
of 80
pro vyhledávání: '"C.R. Houska"'
Autor:
J. Unnam, C.R. Houska
Publikováno v:
Scripta Metallurgica. 8:509-512
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf6797014258b46ceafedb94f24ab816
https://doi.org/10.1016/0036-9748(74)90060-x
https://doi.org/10.1016/0036-9748(74)90060-x
Autor:
S. Rao, C.R. Houska
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 42:14-19
The line profiles from a sample containing small spherical particles, non-uniform strain and instrumental broadening can be described exactly by using error functions with complex arguments. Consequently, the development by Houska & Smith [J. Appl. P
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1176c85551043d9c82226333f11464c2
https://doi.org/10.1107/s010876738609997x
https://doi.org/10.1107/s010876738609997x
Autor:
C.R. Houska, S. Rao
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 42:6-13
X-ray diffraction profiles and Fourier coefficients are given for particles distributed according to experimentally verified size distributions. Calculations are based upon the log normal distribution of sphere diameters and intercept lengths in addi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4e67a47d5a5d67388bdf5a81fc9365b
https://doi.org/10.1107/s0108767386099981
https://doi.org/10.1107/s0108767386099981
Autor:
C.R. Houska
Publikováno v:
Thin Solid Films. 25:451-464
X-ray diffraction has been used to provide a non-destructive measurement of composition profiles in diffused films, as well as simultaneous measurements of those structural changes associated with diffusion processes. Two methods are discussed which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d38a180006f5650b91c416e176193d8
https://doi.org/10.1016/0040-6090(75)90064-4
https://doi.org/10.1016/0040-6090(75)90064-4
Publikováno v:
Thin Solid Films. 79:27-38
Molybdenum and titanium films prepared with a rotating r.f. diode system were examined by X-ray diffraction for strain and texture. Both films were deposited onto (111)-oriented silicon crystal substrates. Molybdenum films 1.13 μm thick sputtered wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::431de7c5aa5f9524c33088fae1d9374b
https://doi.org/10.1016/0040-6090(81)90425-9
https://doi.org/10.1016/0040-6090(81)90425-9
Autor:
C.R. Houska, S. Rao
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 41:513-517
This paper provides an exact solution for the X-ray diffraction line shape from a bent crystal with linear strain. Such crystals may be found along concentration gradients in a diffusion or ion-implanted zone, thin films and cold-worked materials. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c6ef67e68a73329b363d1af5ec6070c
https://doi.org/10.1107/s0108767385001143
https://doi.org/10.1107/s0108767385001143
Autor:
C.R. Houska, J. Unnam
Publikováno v:
Scripta Metallurgica. 8:801-804
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58bc929d19b2a3c4e17e4cdfeb39e70d
https://doi.org/10.1016/0036-9748(74)90298-1
https://doi.org/10.1016/0036-9748(74)90298-1
Publikováno v:
Thin Solid Films. 44:217-231
Diffusion in films is found to have complications that are either absent or less obvious in the case of diffusion in bulk samples. This results largely from the presence of at least one surface always near the diffusion zone. Long term diffusion trea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cebfcd5095739dbaeba922512248769
https://doi.org/10.1016/0040-6090(77)90457-6
https://doi.org/10.1016/0040-6090(77)90457-6
Autor:
S. V. Nagender Naidu, C.R. Houska
Publikováno v:
Metallurgical Transactions. 2:309-313
The structure of highly deformed filings of the Pd-Ag-Au ternary alloy system has been studied by using the Warren-Averbach X-ray diffraction line profile analysis. The effective particle size and root mean square strain were determined over a range
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0aa16cd1c03fa2ce316ec94b90c2a605
https://doi.org/10.1007/bf02662677
https://doi.org/10.1007/bf02662677
Autor:
C.R. Houska, J. Unnam
Publikováno v:
Scripta Metallurgica. 8:61-64
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4978fb588a4eb7c602e24d8f17f92cd
https://doi.org/10.1016/0036-9748(74)90441-4
https://doi.org/10.1016/0036-9748(74)90441-4