Zobrazeno 1 - 10
of 39
pro vyhledávání: '"C.M. Demanet"'
Autor:
C.M. Demanet
Publikováno v:
Applied Surface Science. 135:53-58
Scanning force microscopy (SFM) was used to study the sputter cones resulting from the 5 keV Ne + bombardment of an InP (100) surface. Atomic force microscopy, force modulation microscopy (FMM) and phase detection microscopy (PDM) images allow to dis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4b94aa1be7099a7ad63e615c497b0e3
https://doi.org/10.1016/s0169-4332(98)00306-7
https://doi.org/10.1016/s0169-4332(98)00306-7
Autor:
C.M. Demanet
Publikováno v:
Applied Surface Science. 89:97-101
We report on the first AFM images to our knowledge of the surface topography of fly-ash glassy spheres. Optically, two types of spheres are observed: large ones (more than 100 μm diameter) appear dark, small ones (up to 10 μm diameter) appear clear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3874d985086201be0cf937552c8cc10
https://doi.org/10.1016/0169-4332(95)00030-5
https://doi.org/10.1016/0169-4332(95)00030-5
Autor:
C.M. Demanet, M. Steinberg
Publikováno v:
Applications of Surface Science. 14:271-280
The influence of the temperature on the surface state of an industrial CoMo/γ-Al 2 O 3 catalyst has been studied by XPS. At room temperature Mo is present on the surface as Mo(VI). When increasing the temperature, Mo(VI) is reduced to Mo(V). The red
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::744abac892aa7428413c71fc72b585a2
https://doi.org/10.1016/0378-5963(83)90042-9
https://doi.org/10.1016/0378-5963(83)90042-9
Autor:
C. Le Gressus, M. Henriot, Charles Darnez, J. P. Duraud, C. Lecomte, C.M. Demanet, Emmanuel Balanzat, A. Le Moël, M.T. Valin
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 32:115-119
Modifications induced by energetic ions have been investigated in the regime of electronic stopping power by X-ray photoemission spectroscopy (XPS), infrared absorption spectroscopy (IRAS) and differential scanning calorimetry (DSC). Stacks of thin f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40a291397f1f6d043280cba100e3584f
https://doi.org/10.1016/0168-583x(88)90192-9
https://doi.org/10.1016/0168-583x(88)90192-9
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 32:182-185
Monochromatized X-ray photoelectron spectroscopy (XPS) has been used to investigate the physical and chemical modifications induced in PVDF (polyvinyledene fluoride) surfaces by high energy oxygen ions. The use of monochromatic X-radiation provides a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7919a392561680727b0f3d62e3f3320
https://doi.org/10.1016/0168-583x(88)90206-6
https://doi.org/10.1016/0168-583x(88)90206-6
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 35:203-209
Intensities of X-ray photoelectron transitions from the As 3 d level are theoretically analysed taking into account many-electron interactions. The latter interactions profoundly affect the relative intensities of the transitions as well as binding e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b6d430c7afbe155dc012e0ab7316aee
https://doi.org/10.1016/0368-2048(85)80057-8
https://doi.org/10.1016/0368-2048(85)80057-8
Publikováno v:
Applied Surface Science. 25:279-287
A SIMS analysis of an evaporated In contact on (HgCd)Te is reported. A multi-layer model reflecting the interaction of In with the oxides present on the substrate surface is deduced from the analysis.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83c4aa8c446e0620a6f84609f61e9261
https://doi.org/10.1016/0169-4332(86)90060-7
https://doi.org/10.1016/0169-4332(86)90060-7
Autor:
C.M. Demanet
Publikováno v:
Inorganica Chimica Acta. 76:L273-L274
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14d034eade36406eac6e47d21946b7fa
https://doi.org/10.1016/s0020-1693(00)81534-0
https://doi.org/10.1016/s0020-1693(00)81534-0
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