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Akademický článek

Effect of rumen-protected methionine supplementation to beef cows during the periconception period on performance of cows, calves, and subsequent offspring

Autor: G.M. Silva, C.D. Chalk, J. Ranches, T.M. Schulmeister, D.D. Henry, N. DiLorenzo, J.D. Arthington, P. Moriel, P.A. Lancaster

Publikováno v: Animal, Vol 15, Iss 1, Pp 100055- (2021)

Maternal nutrition affects the development of the fetus and postnatal performance of the calf. Methionine may play a critical role in developmental programming and is likely deficient in beef cows fed low-quality forage. The objective of this study w

Externí odkaz: https://doaj.org/article/2ec81a71dd2d4292bdd24020f7923296

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Effect of rumen-protected methionine supplementation to beef cows during the periconception period on performance of cows, calves, and subsequent offspring

Autor: C.D. Chalk, John D. Arthington, Gleise Medeiros da Silva, P.A. Lancaster, Nicolas DiLorenzo, Philipe Moriel, Tessa M Schulmeister, Darren D Henry, Juliana Ranches

Publikováno v: Animal, Vol 15, Iss 1, Pp 100055-(2021)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10414f7a0a92d6a786a01eb480526f80
https://doi.org/10.1016/j.animal.2020.100055

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Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations

Autor: I.M. Bell, C.D. Chalk, Mark Zwolinski, S.J. Spinks

Publikováno v: Journal of Electronic Testing. 20:11-23

The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evalua

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4c75e0da5c1733f353ce2c5dfea46a8
https://doi.org/10.1023/b:jett.0000009310.48706.b7

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Applying a robust heteroscedastic probabilistic neural network to analog fault detection and classification

Autor: A.C. Williams, Mark Zwolinski, C.D. Chalk, Zheng Rong Yang

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19:142-151

The problem of distinguishing and classifying the responses of analog integrated circuits containing catastrophic faults has aroused recent interest. The problem is made more difficult when parametric variations are taken into account. Hence, statist

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5c80f0486d17c3e7e5d3dcbe7b9c5ae6
https://doi.org/10.1109/43.822626

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A design for test technique to increase the resolution of analogue supply current tests

Autor: Mark Zwolinski, C.D. Chalk

Publikováno v: ICECS

By employing the new DFT technique proposed here, the fault coverage of the AC RMS supply current test for an opamp within a CMOS analogue multiplier circuit was increased to 100%. The DFTT scheme is based on reducing the width of high current transi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::96b25098b3320bbbdc401575d598b989
https://doi.org/10.1109/icecs.1998.814867

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Generation and verification of tests for analogue circuits subject to process parameter deviations

Autor: C.D. Chalk, S.J. Spinks, Mark Zwolinski, I.M. Bell

Publikováno v: DFT

The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evalu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2fb3abfe7557143557edcc5d5ae7c43c
https://doi.org/10.1109/dftvs.1997.628315

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A DFT technique to increase the resolution of AC RMS power supply current monitoring of complex analogue circuits

Autor: C.D. Chalk, Mark Zwolinski, B.R. Wilkins

Publikováno v: Scopus-Elsevier

RMS AC supply current monitoring with the addition of the novel DFT technique presented in this paper shows an increase in fault coverage for an embedded opamp from only 2.5% to over 70%. During a test, the effective width-length ratio of the transis

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f94a782a1540fa9bd2b5b116c65b2b6f
https://doi.org/10.1049/ic:19971200

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Akademický článek

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Bootstrap, an alternative to Monte Carlo simulation

Autor: Z. R. Yang, C.D. Chalk, Mark Zwolinski

Publikováno v: Electronics Letters. 34:1174

The Monte Carlo simulation is a commonly used technique for circuit analysis, but is computationally expensive. The bootstrap method can save simulation time and retain the desired accuracy.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8870f018871ebbb6acd2fc3b3a71ff2a
https://doi.org/10.1049/el:19980847

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