Zobrazeno 1 - 10
of 52
pro vyhledávání: '"C.D. Chalk"'
Autor:
G.M. Silva, C.D. Chalk, J. Ranches, T.M. Schulmeister, D.D. Henry, N. DiLorenzo, J.D. Arthington, P. Moriel, P.A. Lancaster
Publikováno v:
Animal, Vol 15, Iss 1, Pp 100055- (2021)
Maternal nutrition affects the development of the fetus and postnatal performance of the calf. Methionine may play a critical role in developmental programming and is likely deficient in beef cows fed low-quality forage. The objective of this study w
Externí odkaz:
https://doaj.org/article/2ec81a71dd2d4292bdd24020f7923296
Autor:
C.D. Chalk, John D. Arthington, Gleise Medeiros da Silva, P.A. Lancaster, Nicolas DiLorenzo, Philipe Moriel, Tessa M Schulmeister, Darren D Henry, Juliana Ranches
Publikováno v:
Animal, Vol 15, Iss 1, Pp 100055-(2021)
Maternal nutrition affects the development of the fetus and postnatal performance of the calf. Methionine may play a critical role in developmental programming and is likely deficient in beef cows fed low-quality forage. The objective of this study w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10414f7a0a92d6a786a01eb480526f80
https://doi.org/10.1016/j.animal.2020.100055
https://doi.org/10.1016/j.animal.2020.100055
Publikováno v:
Journal of Electronic Testing. 20:11-23
The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evalua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4c75e0da5c1733f353ce2c5dfea46a8
https://doi.org/10.1023/b:jett.0000009310.48706.b7
https://doi.org/10.1023/b:jett.0000009310.48706.b7
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19:142-151
The problem of distinguishing and classifying the responses of analog integrated circuits containing catastrophic faults has aroused recent interest. The problem is made more difficult when parametric variations are taken into account. Hence, statist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c80f0486d17c3e7e5d3dcbe7b9c5ae6
https://doi.org/10.1109/43.822626
https://doi.org/10.1109/43.822626
Autor:
C.D. Chalk, Mark Zwolinski
Publikováno v:
Electronics Letters. 31:1398-1400
A SPICE macromodel of a CMOS operational amplifier is described in which the supply current is modelled. This macromodel is suited to multilevel analogue fault simulation. The accuracy of the macromodel is demonstrated by comparison with the full tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fa2054e6e542be7306fbdba529acfea
https://doi.org/10.1049/el:19951006
https://doi.org/10.1049/el:19951006
Autor:
Mark Zwolinski, C.D. Chalk
Publikováno v:
ICECS
By employing the new DFT technique proposed here, the fault coverage of the AC RMS supply current test for an opamp within a CMOS analogue multiplier circuit was increased to 100%. The DFTT scheme is based on reducing the width of high current transi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96b25098b3320bbbdc401575d598b989
https://doi.org/10.1109/icecs.1998.814867
https://doi.org/10.1109/icecs.1998.814867
Publikováno v:
DFT
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evalu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fb3abfe7557143557edcc5d5ae7c43c
https://doi.org/10.1109/dftvs.1997.628315
https://doi.org/10.1109/dftvs.1997.628315
Publikováno v:
Journal of Electronic Testing; Feb2004, Vol. 20 Issue 1, p11-23, 13p
Publikováno v:
Scopus-Elsevier
RMS AC supply current monitoring with the addition of the novel DFT technique presented in this paper shows an increase in fault coverage for an embedded opamp from only 2.5% to over 70%. During a test, the effective width-length ratio of the transis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f94a782a1540fa9bd2b5b116c65b2b6f
https://doi.org/10.1049/ic:19971200
https://doi.org/10.1049/ic:19971200
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