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pro vyhledávání: '"C. Y. Belhadj"'
Autor:
S. Ben Amor, R. J. Higgins, E. Hempfling, J. J. L. Rascol, Kevin P. Martin, Robert C. Potter, C. Y. Belhadj, H. Hier
Publikováno v:
Applied Physics Letters. 57:58-60
Using the stable, dc current‐voltage (I‐V) curve measured from a double‐barrier resonant tunneling structure, we have studied the effects of external circuit elements on device oscillations. A simulation, using the experimental I‐V and a simp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8e3d0500468f958b4b16e7066552370
https://doi.org/10.1063/1.103577
https://doi.org/10.1063/1.103577
