Zobrazeno 1 - 10
of 17
pro vyhledávání: '"C. Y. Belhadj"'
Autor:
S. Ben Amor, R. J. Higgins, E. Hempfling, J. J. L. Rascol, Kevin P. Martin, Robert C. Potter, C. Y. Belhadj, H. Hier
Publikováno v:
Applied Physics Letters. 57:58-60
Using the stable, dc current‐voltage (I‐V) curve measured from a double‐barrier resonant tunneling structure, we have studied the effects of external circuit elements on device oscillations. A simulation, using the experimental I‐V and a simp
Autor:
Vdovin, E. E.1 (AUTHOR) vdov62@yandex.ru, Khanin, Yu. N.1 (AUTHOR)
Publikováno v:
JETP Letters. May2021, Vol. 113 Issue 9, p586-591. 6p.
Publikováno v:
Journal of Applied Physics; 2/1/1996, Vol. 79 Issue 3, p1515, 11p, 1 Diagram, 13 Graphs
Autor:
Jogai, B., Koenig, E. T.
Publikováno v:
Journal of Applied Physics; 3/1/1991, Vol. 69 Issue 5, p3381, 3p, 4 Graphs
Autor:
Roblin, Patrick, Rohdin, Hans
Publikováno v:
High-Speed Heterostructure Devices; 2002, p221-264, 44p
Publikováno v:
IEEE Transactions on Electron Devices; 02/01/2011, Vol. 58 Issue 2, p343-347, 5p
Publikováno v:
IEEE Journal of Quantum Electronics; Jul2007, Vol. 43 Issue 7, p580-587, 8p
Publikováno v:
IEEE Electron Device Letters; May2006, Vol. 27 Issue 5, p364-367, 4p, 3 Graphs
Autor:
Niu Jin, Sung-Yong Chung, Ronghua Yu, Di Giacomo, Sandro J., Berger, Paul R., Thompson, Phillip E.
Publikováno v:
IEEE Transactions on Electron Devices; Oct2005, Vol. 52 Issue 10, p2129-2135, 7p
Publikováno v:
IEEE Transactions on Electron Devices; 1996, Vol. 43 Issue 2, p332-341, 10p