Zobrazeno 1 - 3
of 3
pro vyhledávání: '"C. W. ALMGREN"'
Autor:
Rudy Schlaf, A. N. Erickson, M. W. Nelson, Bruce A. Parkinson, P. G. Schroeder, C. W. Almgren
Publikováno v:
Applied Physics Letters. 74:1421-1423
Tapping-mode atomic force microscopy was used to spatially resolve areas of different doping types on Si wafers patterned by photolithography and subsequent ion implantation. Application of a direct current dc bias between cantilever and sample durin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::250b295161738c8c2245d7638014b5ed
https://doi.org/10.1063/1.123569
https://doi.org/10.1063/1.123569
Publikováno v:
Chemischer Informationsdienst. 12
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6985d67295a66b7937b8af5ef7995ff9
https://doi.org/10.1002/chin.198129221
https://doi.org/10.1002/chin.198129221
Publikováno v:
Journal of the American Chemical Society. 103:2098-2099
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3680b48fb918a656b590d909f0057da
https://doi.org/10.1021/ja00398a041
https://doi.org/10.1021/ja00398a041