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pro vyhledávání: '"C. T. Kirk"'
Autor:
Allison M. Halligan, Syed A. Hoda, Jonas J. Heymann, E C T Kirk Facey, F.I.A.C. Rana S. Hoda M.D.
Publikováno v:
Diagnostic Cytopathology. 43:188-194
Background Fine needle aspiration (FNA) of breast masses in pregnant or lactating women is an uncommon procedure, and cytological interpretation is considered problematic due to atypia inherent to secretory change in glandular epithelia. Previous des
Publikováno v:
Journal of Personality and Social Psychology. 63:969-977
Publikováno v:
Applied Physics Letters. 56:1359-1361
We report results of electron spin resonance and capacitance versus voltage measurements of silicon nitride/silicon dioxide/silicon devices subjected to high electric field carrier injection into the nitride and (in some samples) ultraviolet illumina
Publikováno v:
Journal of personality and social psychology. 63(6)
To explain how people judge that others are lying, an expectancy-violation model is proposed. According to the model, deception is perceived from nonverbal behavior that violates normative expectation. To test the model, 3 experiments were conducted,
Autor:
C. T. Kirk
Publikováno v:
Journal of Applied Physics. 50:4190-4195
Certain point defects in amorphous silicon nitride called valence alternation pairs (VAP) appear to be able to account not only for the charge storage and decay characteristics of MNOS memory devices but also for the fatigue phenomena that occur in t
Publikováno v:
Journal of Applied Physics. 39:5104-5116
The measurement of tunnel triodes by a small ac signal r parameter technique is shown to give a new way of directly measuring the oxide barrier height and barrier asymmetry. This type of measurement permits distinguishing between true hot‐electron
Autor:
C. T. Kirk
Publikováno v:
Physical review. B, Condensed matter. 38(2)
The infrared-absorption spectrum of a-${\mathrm{SiO}}_{2}$ is analyzed in terms of its transverse-optic (TO) and longitudinal-optic (LO) vibrational modes. It is shown that the independent-oscillator model for the a-${\mathrm{SiO}}_{2}$ dielectric fu
Publikováno v:
Scopus-Elsevier
Thick oxide films (≈220 nm) have been nitrided heavily in ammonia. Dispersion analysis was performed on infrared transmission spectra of oxide, nitrided oxide, and CVD nitride films. The following conclusions may be drawn from the spectra: nitrided
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9a33543609d329ee61e6b6a584ca72d
http://www.scopus.com/inward/record.url?eid=2-s2.0-0020901033&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0020901033&partnerID=MN8TOARS
Publikováno v:
IEEE Transactions on Electron Devices. 31:1971-1972