Zobrazeno 1 - 10
of 20
pro vyhledávání: '"C. T. Dowell"'
Autor:
W. C. T. Dowell, G. Lehmpfuhl
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 42:569-577
Conditions for the intensity enhancement of a Bragg reflection are investigated through convergent-beam (CB) reflection electron diffraction experiments. This intensity enhancement is of great interest for reflection electron microscopy of surfaces.
Autor:
C. T. Dowell, William C. Bray
Publikováno v:
Journal of the American Chemical Society. 39:896-905
Autor:
J. Gerum, Susanne Marie Beckurts, O. Lüning, A. Heiduschka, J. Deininger, C. H. Bailey, H. Kalning, null Arpin, T. Pecaud, E. Vautier, Th. Merl, A. Reuß, W. Brendler, H. Langfurth, J. Grossfeld, A. Fornet, W. Herter, null Marchadier, null Goujon, G. Testeni, P. Menaul, C. T. Dowell, Th. v. Fellenberg, J. Abel, K. Fricke, E. Arbenz, A. Juckenack, A. Nestler
Publikováno v:
Zeitschrift für Analytische Chemie. 65:84-91
Autor:
P. Goodman, W. C. T. Dowell
Publikováno v:
Philosophical Magazine. 28:471-473
Interference fringes obtained between overlapping diffraction orders in the Kossel-Mollenstedt pattern from a pair of crossed single crystals have been used to demonstrate the degree of coherence across the incident illumination. The experiment also
Autor:
Natsu Uyeda, J. W. Menter, A. L. G. Rees, A. W. Agar, D. W. Pashley, Otto Rang, J. L. Farrant, A. Keller, W. C. T. Dowell, F. C. Frank, Joachim Stabenow, G. A. Bassett, Eiji Suito
Publikováno v:
Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique ISBN: 9783642494819
The work on the observation of moire patterns from overlapping metal films carried out by the authors (1, 2) has already been described in part (3). In this contribution a few of the more important aspects in relation to the application of the techni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::791b8e70fe2aed5b03427b7ed8060835
https://doi.org/10.1007/978-3-642-49765-0_19
https://doi.org/10.1007/978-3-642-49765-0_19
Publikováno v:
Verhandlungen ISBN: 9783662016961
Physikalisch-Technischer Teil ISBN: 9783642501968
Physikalisch-Technischer Teil ISBN: 9783642501968
The fringe patterns which occur in electron micrographs of overlapping thin crystals were first observed almost simultaneously but independently in 1951 by Mitsubishi, Nagasaki and Uyeda (1), by Hillier (2) and by one of us (J. L. F.) (2) and since t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4644cf532ee2adca7b0c349f7f815221
https://doi.org/10.1007/978-3-662-01991-7_112
https://doi.org/10.1007/978-3-662-01991-7_112
Publikováno v:
Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique ISBN: 9783642494819
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63e80e6e08f4597eb1a165a3d8f960c6
https://doi.org/10.1007/978-3-642-49765-0_20
https://doi.org/10.1007/978-3-642-49765-0_20