Zobrazeno 1 - 10
of 18
pro vyhledávání: '"C. Shashank Kaira"'
Publikováno v:
Materials & Design, Vol 168, Iss , Pp - (2019)
Nanolaminates have gained much attention due to exceptional mechanical, optical, electrical and biological properties. In this work, we explore the microstructure and mechanical properties of Al-SiC co-sputtered monolayers having different compositio
Externí odkaz:
https://doaj.org/article/1a06a405a29a4c9ab437e67886f7afbd
Publikováno v:
Acta Materialia. 176:242-249
Even after nearly a century of extensive use of aluminum alloys in structural applications, our understanding of such precipitation-strengthened materials is far from complete. With the advent of next generation advanced characterization techniques,
Publikováno v:
Materials Characterization. 150:207-212
In situ studies using X-ray tomography have gained immense popularity in the recent past owing to their non-destructive nature and ability to capture the microstructure of a wide range of materials in 3D. In this work, we have conducted in situ micro
Autor:
Doga Gursoy, C. Shashank Kaira, Francesco De Carlo, Xiaogang Yang, Nikhilesh Chawla, Vincent De Andrade, William Scullin
Publikováno v:
Materials Characterization. 142:203-210
A unique correlative approach for automated segmentation of large 3D nanotomography datasets obtained using Transmission X-ray Microscopy (TXM) in an Al-Cu alloy has been introduced. Automated segmentation using a Convolutional Neural Network (CNN) a
Autor:
Vincent De Andrade, Jason Williams, Christopher Kantzos, Francesco De Carlo, C. Shashank Kaira, Nikhilesh Chawla
Publikováno v:
Acta Materialia. 144:419-431
A unique approach to correlating an evolving 3D microstructure in an Al-Cu alloy and its micro-scale mechanical properties has been introduced. Using these nanoscale three-dimensional microstructures derived from Transmission X-ray Microscopy (TXM),
Autor:
Nikhilesh Chawla, Ehsan Izadi, Renuka Vallabhaneni, Sudhanshu S. Singh, C. Shashank Kaira, Jagannathan Rajagopalan, Carl R. Mayer
Publikováno v:
Microelectronics Reliability. 79:314-320
Tin and tin-alloyed electroplated films are known to be susceptible to whisker growth under a range of conditions, many of which result in the generation of compressive stresses in the film. Compressive stress is considered to be one of the primary c
Publikováno v:
Acta Materialia. 120:56-67
Uniaxial compression experiments on micron-sized bicrystalline and single-crystalline pillars in tin (Sn) using a flat punch nanoindenter tip, have enabled us to quantify the difference in stress-strain behavior associated with grain boundaries in ti
Publikováno v:
Journal of Microscopy. 264:339-350
An accurate knowledge of the complex microstructure of a heterogeneous material is crucial for its performance prediction, prognosis and optimization. X-ray tomography has provided a nondestructive means for microstructure characterization in 3D and
Autor:
J.C.E. Mertens, C. Shashank Kaira, Jason Williams, Hechao Li, Yang Jiao, Somya Singh, Nikhilesh Chawla
Publikováno v:
JOM. 68:2288-2295
X-ray tomography has provided a non-destructive means for microstructure characterization in three dimensional (3D) and four dimensional (4D) (i.e., structural evolution over time), in which projections of a material’s structure are typically recon
Autor:
F. De Carlo, Sudhanshu S. Singh, C. Shashank Kaira, Christopher Kantzos, V. De Andrade, Nikhilesh Chawla
Publikováno v:
Microscopy and Microanalysis. 23:2220-2221