Zobrazeno 1 - 10
of 81
pro vyhledávání: '"C. Sandstrom"'
Publikováno v:
eXPRESS Polymer Letters, Vol 11, Iss 5, Pp 383-395 (2017)
Linseed (LO) and soybean oil (SO) were in–situ epoxidized with peracetic acid to produce different degree of epoxidized LO and epoxidized SO. For comparison purpose, commercial epoxidized linseed oil (ELO®) and epoxidized soybean oil (ESO®) were
Externí odkaz:
https://doaj.org/article/14878752cf0e4f4498c67a8d88421861
Publikováno v:
eXPRESS Polymer Letters, Vol 11, Iss 5, Pp 383-395 (2017)
Linseed (LO) and soybean oil (SO) were in–situ epoxidized with peracetic acid to produce different degree of epoxidized LO and epoxidized SO. For comparison purpose, commercial epoxidized linseed oil (ELO®) and epoxidized soybean oil (ESO®) were
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92502ec9d2944679c0d743498ab39a82
http://www.expresspolymlett.com/letolt.php?file=EPL-0007882&mi=cd
http://www.expresspolymlett.com/letolt.php?file=EPL-0007882&mi=cd
Autor:
Boden C. Sandstrom
Publikováno v:
American Music. 29:273-276
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e281cb3cd2964faa5d20da36fc5d52ed
https://doi.org/10.5406/americanmusic.29.2.0273
https://doi.org/10.5406/americanmusic.29.2.0273
Akademický článek
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Publikováno v:
Magnetic Resonance Imaging. 9:165-171
In order to predict the most sensitive MR imaging sequence for detecting liver metastases at 1.5 T, in vivo measurements of T1 and T2 relaxation times and proton density were obtained using multipoint techniques. Based on these measurements, two-dime
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76bc43c71fa31d162641d2441ae36535
https://doi.org/10.1016/0730-725x(91)90006-8
https://doi.org/10.1016/0730-725x(91)90006-8
Autor:
William H. Perman, John C. Sandstrom
Publikováno v:
Magnetic Resonance Imaging. 8:5-12
Tuning of nuclear magnetic resonance pulse sequences with pulsed "crusher" gradients or phase cycling serves to remove unwanted spin populations from the data acquisition window. Verification that unwanted spin population are not detected is often de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::15af8b29ddfa89dbe8d1c1ab73aff5f5
https://doi.org/10.1016/0730-725x(90)90205-g
https://doi.org/10.1016/0730-725x(90)90205-g
Publikováno v:
ICMB
This paper addresses entrepreneurship in the emerging Swedish mobile Internet industry. In this work, the mobile Internet is defined as a function. Entrepreneurship is defined as the creation of a new venture. The unique data set underlying this work
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b37aa57bc93ca9050fc4a2e5e643bde
https://doi.org/10.1109/icmb.2006.328141
https://doi.org/10.1109/icmb.2006.328141
Publikováno v:
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..
This paper demonstrates that the threshold voltages of CMOS transistors can vary significantly depending on their proximity to well boundary. This well proximity effect (WPE) is caused by the well implant atoms that scatter laterally from the photo-r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d74d6cfc77c90bfed714aafc556e1589
https://doi.org/10.1109/issm.2005.1513333
https://doi.org/10.1109/issm.2005.1513333
Autor:
G. McMahon, P. Mitchell, B. Jin, J. Fewkes, A. Gordon, J. Nulty, K. Wong, C. Sandstrom, L. Kavan, M. Carpenter, C. Seams
Publikováno v:
IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168).
A focus on region yield is demonstrated to improve the systematic yield from 75% to the upper 90% to achieve a quick learning curve in defect density on new products. A learning curve to drive both the random and systematic yield simultaneously are i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::203daf48ed74d2384146b785932dc365
https://doi.org/10.1109/asmc.1998.731405
https://doi.org/10.1109/asmc.1998.731405
Conference
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