Rational Engineering of the Dielectric Properties of Thin Silica Layers with a Single Plane of AgNPs

Autor: Kremena Makasheva, Laurent Boudou, Mohamed Belhaj, S. Dadouch, Gilbert Teyssedre, C. Rigoudy

Publikováno v: IEEE Internat. Conf. on Dielectrics (ICD), Valencia, Spain, 5-9 July 2020
IEEE Internat. Conf. on Dielectrics (ICD), Valencia, Spain, 5-9 July 2020, Jul 2020, Valencia, Spain. pp. 205-208
HAL

International audience; Interface properties of dielectrics are of outmost importance when dealing with phenomena as charge injection or secondary electron emission. When the dielectric thickness scales down to the nm range, a deviation from the bulk

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eededf28e72d499794333999a89707ae
https://hal.archives-ouvertes.fr/hal-03003165/file/ICD-2020-ID1235.pdf

On the secondary electron emission phenomenon when originating from very thin layers

Autor: S. Dadouch, Kremena Makasheva, Gilbert Teyssedre, Laurent Boudou, C. Rigoudy, Mohamed Belhaj

Publikováno v: 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO)
2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), Jul 2017, Pittsburgh, United States. pp.515-516, ⟨10.1109/NANO.2017.8117275⟩

International audience; The secondary electron emission phenomenon lays down the principle of operation of many physical devices and processes. Although it is fairly well described in the case of irradiation of metals there is still lack of informati

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::476eb0d27712fba75ae54c3f8739adf1
https://hal.archives-ouvertes.fr/hal-02324440

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