Zobrazeno 1 - 6
of 6
pro vyhledávání: '"C. R. Tonheim"'
Autor:
Kjell Ove Kongshaug, E. Selvig, R. Haakenaasen, L. Trosdahl-Iversen, C. R. Tonheim, J. B. Andersen, T. Lorentzen, Paul Gundersen
Publikováno v:
Journal of Electronic Materials. 39:893-902
This paper presents results from recent work on molecular beam epitaxy growth of HgCdTe at the Norwegian Defence Research Establishment (FFI), including studies of material properties and fabrication of photodiodes and nanostructures. Systematic stud
Publikováno v:
Journal of Electronic Materials. 37:1444-1452
The defect morphology in HgTe and CdHgTe was studied in (211)B-oriented layers grown in a 20°C temperature range around the optimal growth temperature. The density of defects varies strongly with the growth temperature. In HgTe, the shape of the mic
Autor:
T. Lorentzen, Erik Brendhagen, Trond Brudevoll, S Nicolas, R. Haakenaasen, E. Selvig, M Breivik, C. R. Tonheim, A D van Rheenen, Harald Steen
Publikováno v:
Journal of Physics: Conference Series. 100:042041
We present important aspects of photoluminescence (PL) of CdxHg1-xTe in the infrared part of the spectrum where background thermal radiation significantly affects the PL spectrum. We show how the background spectrum can be removed from the data. We a
Publikováno v:
Journal of Physics: Conference Series. 100:042024
A study of the photoluminescence from a four-period CdxHg1-xTe multiple quantum well structure at 11 K as a function of excitation density is presented. High-resolution X-ray diffraction and transmission electron microscopy revealed that the quantum
Autor:
R. Haakenaasen, C. R. Tonheim, Torbjørn Skauli, Henrik Hemmen, T. Lorentzen, E. Selvig, Kjell Ove Kongshaug
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 26:525
A systematic study of the evolution of the defect morphology and crystalline quality in molecular beam epitaxially grown CdxHg1−xTe epilayers with growth temperature is presented. The layers were characterized with optical microscopy, atomic force
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 25:1776