Zobrazeno 1 - 10
of 41
pro vyhledávání: '"C. R. Ottermann"'
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 358:290-293
Densities, ρ, of thin TiO2 layers, produced by reactive evaporation (RE) and ion plating (IP) have been analyzed by means of grazing incidence X-ray reflectometry (GIXR). Depending on the deposition conditions, the layers are amorphous or polycrysta
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 358:315-318
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 113:288-292
Thin oxide films have a broad range of applications in optical devices. Titania (TiO2) is a frequently used oxide material for optical coatings because of its high refractive index (≈ 2.4) and low absorption. The development of devices and optimiza
Publikováno v:
Thin Solid Films. 235:228-233
Evaporated amorphous tungsten oxide films with low densities, deposited on different substrates, have been irradiated with various types of ions of different energies up to 30 MeV, and with fluences up to 10 18 cm −2 . Compaction of the films up to
Publikováno v:
Surface and Interface Analysis. 19:435-438
Hydrogen and hydrogen-containing species (H 2 O, OH etc) play a dominant role in the various properties of glass surfaces and technical oxidic thin films deposited on glass. The amount of hydrogen and its distribution with depth are influenced by pre
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 68:262-265
Tungsten oxide films produced by reactive evaporation were analyzed using the 15 N technique for H profiling, RBS with 4 He ions and ERD with 40 Ar ions. The film stoichiometry was determined as WO 3.0 H 0.3 +aH 2 O, where the second term describes t
Publikováno v:
Physical Review B. 44:5927-5930
The ac conduction in NiO films has been investigated in the frequency range 10 Hz < v < 10^9 Hz and at temperatures between 10 and 300 K. The frequency and the temperature dependence of the electrical conductivity can be consistently explained within
Publikováno v:
Thin Solid Films. 197:279-285
High refractive TiO2 films deposited by reactive electron beam evaporation, reactive ion plating and dip coating have been characterized by optical spectroscopy, electron spectroscopy for chemical analysis, Rutherford backscattering spectroscopy, nuc
Autor:
R. R. Johnson, E. T. Boschitz, M. Wessler, C. R. Ottermann, U. Wiedner, W. Gyles, H. Garcilazo, R. Tacik
Publikováno v:
Physical Review C. 42:1846-1852
The triple differential cross section {ital d}{sup 3}{sigma}/{ital d}{Omega}{sub {ital p}}{sub 1}{ital d}{Omega}{sub {ital p}}{sub 2}{ital d}{sub p}{ital p}{sub 1} was measured for the {pi}{sup +}{ital d}{r arrow}{pi}{sup 0}{ital pp} reaction as a fu
Publikováno v:
Surface and Interface Analysis. 16:331-334
The hydrogen concentration profiles of electrochromic multilayer systems produced by evaporation have been determined by means of nuclear reaction analysis. The H content of individual oxidic materials was found to be larger than for single films, es