Zobrazeno 1 - 10
of 74
pro vyhledávání: '"C. Montandon"'
Autor:
R. Aubry, M.-C. Montandon
Publikováno v:
Éthique & Santé. 16:142-148
Resume La grippe saisonniere peut engendrer des consequences graves chez les personnes âgees. Ainsi, il est recommande aux personnes a risques et a celles qui les cotoient de se faire vacciner, pour reduire l’incidence de la gravite, des complicat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ebb4fb6e49ec5d2d0c6c18d4cf28f42
https://doi.org/10.1016/j.etiqe.2019.05.002
https://doi.org/10.1016/j.etiqe.2019.05.002
Publikováno v:
Radiation Effects and Defects in Solids. 145:213-223
SIMS (Secondary Ion Mass Spectroscopy) is extensively used in microelectronics in order to measure the depth profiles of dopants in silicon wafers. During the SIMS analysis, the sputtering ion beam induces several mass transport processes (collisiona
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::34e567b0e184e1e26228c1896786d7ab
https://doi.org/10.1080/10420159808225765
https://doi.org/10.1080/10420159808225765
Publikováno v:
Radiation Effects and Defects in Solids. 141:37-52
Secondary ion mass spectroscopy (SIMS) is one of the most important tools in analyzing dopant profiles in silicon technology. During SIMS analysis, target atoms are sputtered by an ion beam so that, by mass separation, depth profiles of impurities ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6aa87e32bc953b226f0376bfc3ef493
https://doi.org/10.1080/10420159708211555
https://doi.org/10.1080/10420159708211555
Publikováno v:
Journal de Physique I. 4:991-995
The development of the Low-Energy Cluster Beam Deposition (LECBD) technique represents a new way for the synthesis of cermets. Bi-SiO x thin films have been produced by codeposition of neutral Bi clusters and SiO x molecules. A Transmission Electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee580116f3bb18067a4b3ec3dd9db5c0
https://doi.org/10.1051/jp1:1994178
https://doi.org/10.1051/jp1:1994178
Publikováno v:
Nanostructured Materials. 4:353-364
The growth of Bi films obtained by low-energy cluster beam deposition (LECBD) is compared to those obtained by classical molecular beam deposition (MBD). For these two deposition techniques, significant differences in the very first stages of growth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::277d99309d150b3b1bf9e324dcfea8af
https://doi.org/10.1016/0965-9773(94)90145-7
https://doi.org/10.1016/0965-9773(94)90145-7
Publikováno v:
Journal of Physics D: Applied Physics. 26:1114-1119
Electrical and chemical properties of Bi films produced by low-energy cluster beam deposition (LECBD) are studied and compared with those of films made by molecular beam deposition (MBD). For LECBD Bi films, increase of roughness and decrease of film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::784fa35c3fdcddb37b173bf67407484b
https://doi.org/10.1088/0022-3727/26/7/017
https://doi.org/10.1088/0022-3727/26/7/017
Autor:
B. Cabaud, Patrice Mélinon, F. Santos Aires, C. Montandon, G. Fuchs, Alain Hoareau, Michel Treilleux
Publikováno v:
Philosophical Magazine A. 67:1071-1079
The morphology of supported Bi particles is studied using the technique of profile imaging at atomic resolution. These particles show a crystallized Bi core surrounded by an amorphous (or liquid) material. For small supported particles (diameter of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66b37aeec1c4c26c364e301778db437f
https://doi.org/10.1080/01418619308224758
https://doi.org/10.1080/01418619308224758
Autor:
J. F. Drogou, Fivos Andritsos, A. Arnedo Pena, A. Fidani, J.L. Cozijn, P. Davies, A. Castex, K. J. Charatsis, D. Hoornstra, C. Derdas, C. Montandon, P.A. Konstantinopoulos, D.E. Mazarakos, S. Ametler, J. P. Lívèque, L. Candini, Franck Geffard, Vassilis Kostopoulos, V. Estrada, F. Pecot, M. Delauze
A method for the prompt and cost-effective intervention and remediation of tanker wrecks dealing with eventual leaks and recovering the fuel trapped in their tanks, even at considerable depths, is described. The method is of general applicability as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::070004486c400f71e30d189fa06c5844
http://www.iosc.org/papers/search1.asp
http://www.iosc.org/papers/search1.asp
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