Zobrazeno 1 - 7
of 7
pro vyhledávání: '"C. M. Schlepütz"'
Autor:
P Anagnostopoulou, S Blaskovic, D Schittny, E Borisova, F Kronig, S K Ganesh, Z Zhou-Suckow, M A Mall, C M Schlepütz, M Stampanoni, J C Schittny
Publikováno v:
03.02 - Airway cell biology and immunopathology.
Autor:
T. Phillips, T. Bultreys, J. Van Stappen, S. Van Offenwert, B. Callow, M. Borji, K. Singh, E. Clemens Boersheim, V. Novak, C. M. Schlepütz, V. Cnudde, A. Busch
Publikováno v:
Sixth International Conference on Fault and Top Seals.
Autor:
A K, Yadav, C T, Nelson, S L, Hsu, Z, Hong, J D, Clarkson, C M, Schlepütz, A R, Damodaran, P, Shafer, E, Arenholz, L R, Dedon, D, Chen, A, Vishwanath, A M, Minor, L Q, Chen, J F, Scott, L W, Martin, R, Ramesh
Publikováno v:
Nature. 534(7605)
Autor:
S A, Pauli, S J, Leake, B, Delley, M, Björck, C W, Schneider, C M, Schlepütz, D, Martoccia, S, Paetel, J, Mannhart, P R, Willmott
Publikováno v:
Physical review letters. 106(3)
The evolution of the atomic structure of LaAlO_{3} grown on SrTiO_{3} was investigated using surface x-ray diffraction in conjunction with model-independent, phase-retrieval algorithms between two and five monolayers film thickness. A depolarizing bu
Autor:
C. M. Schlepütz, P. R. Willmott, S. A. Pauli, R. Herger, D. Martoccia, M. Björck, D. Kumah, R. Clarke, Y. Yacoby, Rogério Magalhaes Paniago
Publikováno v:
AIP Conference Proceedings.
The availability of high‐brilliance hard x‐ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x‐ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure fa
Autor:
P R, Willmott, S A, Pauli, R, Herger, C M, Schlepütz, D, Martoccia, B D, Patterson, B, Delley, R, Clarke, D, Kumah, C, Cionca, Y, Yacoby
Publikováno v:
Physical review letters. 99(15)
The complete atomic structure of a five-monolayer film of LaAlO3 on SrTiO3 has been determined for the first time by surface x-ray diffraction in conjunction with the coherent Bragg rod analysis phase-retrieval method and further structural refinemen
Autor:
Zoran Ristić, U. Scotti di Uccio, Christian M. Schlepütz, Paolo Perna, F. Miletto Granozio, N. Lampis, Milan Radovic, Marco Salluzzo
Publikováno v:
Applied Physics Letters. 94:022901
A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed laser deposition on suitably prepared NdGaO3 (110) substrat