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pro vyhledávání: '"C. M. Rose"'
Akademický článek
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Autor:
A R, Kagan, C M, Rose, J M, Bedwinek, P H, Blitzer, D J, Brascho, A P, Brown, L R, Coia, J D, Earle, N A, Janjan, R O, Lowy, R S, Pieters, M, Rotman, S A, Leibel
Publikováno v:
Radiology.
When cone penetrometer testing (CPT) technology is used with in-situ sensors and probes to characterize subsurface conditions in environmental investigations, each sensor must be calibrated with high quality, site specific data to establish essential
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6bb824137f8ca1d12a483bf2986181ef
https://doi.org/10.2172/642676
https://doi.org/10.2172/642676
Publikováno v:
International journal of radiation oncology, biology, physics. 35(4)
In summary, the ASTRO Committee on Human Resources believes that there is ample evidence for the existence of an oversupply of radiation oncologists in the United States at the present time. It believes that this oversupply has already affected the s
Autor:
C M, Rose, J H, Zernik
Publikováno v:
Journal of clinical orthodontics : JCO. 30(2)
Publikováno v:
SPIE Proceedings.
The EBES4 electron beam lithography system was designed to optimize overlay and edge placement accuracy. Unique features such as 1/64 micrometer vector scan addressing, figure by figure dose modulation and a high brightness thermal field emission (TF
Publikováno v:
Photomask and X-Ray Mask Technology.
The i-line stepper is the major manufacturing tool for the exposure of critical levels in the 16 Mb DRAM. There is great advantage to extend the resolution of this technology to the 0.35pmregime in order to use it in the manufacture of 64 Mb DRAMs or
Publikováno v:
Photomask and X-Ray Mask Technology.
Mask and reticle writing requirements for 256 Mb and 1 Gb DRAM production will place stringent demands on lithography tool capabilities. The Lepton EBES4 mask writer addresses these requirements by utilizing advanced generation e-beam technology whic
Autor:
A. R. von Neida, Herbert A. Waggener, Darryl Peters, D. C. Fowlis, C. M. Rose, William P. Wilson
Publikováno v:
Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing III.
Performance specifications, electron gun parameters, selected testing results, and calculated throughput are presented for the second prototype EBES4 which is entering manufacture. The thermal field emitter electron gun is designed for high flux, hig
Autor:
William P. Wilson, A. R. von Neida, D. C. Fowlis, Herbert A. Waggener, Darryl Peters, C. M. Rose
Publikováno v:
SPIE Proceedings.
Performance specifications, electron gun parameters, testing results to date, and throughput are presented for the second prototype EBES4 which is entering manufacture. The thermal field emitter electron gun is designed for high flux, high current st