Zobrazeno 1 - 10
of 11
pro vyhledávání: '"C. M. Loxton"'
Publikováno v:
ChemInform. 22
Publikováno v:
Metallurgical Transactions A. 23:2631-2639
In this study, the isothermal oxidation behavior of laser-clad NbAl3 has been investigated in the temperature range between 800 °C and 1400 °C in air. The effect on oxidation of vanadium microalloying, used to increase the ductility of the otherwis
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 10:468-476
Surface diffusion is shown to be the important factor in sputter–induced ripple and cone development on GaAs and InP surfaces for conditions typical of depth profiling when using surface analysis techniques. Ripple formation has been observed on bo
Publikováno v:
Physica Scripta. :106-109
We present a theoretical model for non-cascade sputtering processes in which these processes are considered to be induced by vibrational excitation. We discuss in particular the application of this model to sputtering (both with and without charge tr
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 7:17-20
A commercial sputtered neutral mass spectrometer, using a rf‐generated plasma for both sputtering and postionization of sputtered particles, has been modified to improve sensitivity for trace analysis. The modified instrument has been used to depth
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 4:1232-1235
The effects of glow discharge cleaning (GDC) and ion‐impact desorption (IID) of impurities on 302 stainless steel were compared using Auger electron spectroscopy (AES). Hydrogen GDC was done in a chamber attached to the Auger microprobe allowing tr
Publikováno v:
Physics and Chemistry of Minerals. 12:261-270
We have conducted detailed studies of the behavior of carbon on the surfaces of MgO and olivine single crystals using various surface analytical techniques: viz. secondary ion mass spectrometry (SIMS), Auger electron spectrometry (AES) and X-ray phot
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 6:44-50
A new secondary‐ion mass spectrometry technique is described for the quantitative analysis and depth profiling of rare gases incorporated in thin films and bulk solids. A Cs+ primary‐ion beam incident on the sample surface was used to produce spu
Publikováno v:
Springer Series in Chemical Physics ISBN: 9783642827266
SIMS measurements of concentrations at, or near, an interface are complicated by changes in the degree of ionization of sputtered atoms, in the sputter rate and in any selective sputtering effects [1]. For practical applications, bombardment conditio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d4a704e9025f10ad4b67c064603becd
https://doi.org/10.1007/978-3-642-82724-2_76
https://doi.org/10.1007/978-3-642-82724-2_76
Publikováno v:
Springer Series in Surface Sciences ISBN: 9783642733451
Ni3A1(110) has been found by Low Energy Ion Scattering (LEIS) to exhibit significantly different oxide growth behaviour over a range of temperatures from room temperature to 800° C. At room temperature the oxygen bond to the surface is weak while at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::144d8726732d7f9cdf7f1e82897a8990
https://doi.org/10.1007/978-3-642-73343-7_42
https://doi.org/10.1007/978-3-642-73343-7_42