Zobrazeno 1 - 10
of 23
pro vyhledávání: '"C. Kalamani"'
Publikováno v:
Automatika, Vol 65, Iss 1, Pp 290-303 (2024)
ABSTRACTThe digital filters play a significant role in the field of digital signal processing (DSP). The finite impulse response (FIR) filter is an attractive choice because of the ease of design and good stability. The digital filters have a wide va
Externí odkaz:
https://doaj.org/article/4dfe4fd357fe48d2aa10ba6728ea85a8
Publikováno v:
Measurement: Sensors, Vol 31, Iss , Pp 100989- (2024)
The digital modules are the building block of all the applications in digital world. Encoders and decoders play a vital role in numerous applications. The Encoder - Decoder framework is a major stream deep learning design for all computing applicatio
Externí odkaz:
https://doaj.org/article/6bba92170e534bad840c362a42468947
Publikováno v:
In Measurement: Sensors October 2024 35
Publikováno v:
Automatika: Journal for Control, Measurement, Electronics, Computing & Communications; Dec2023, Vol. 64 Issue 4, p772-782, 11p
Publikováno v:
Optik. :170438
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54a42f62705ba62a0e25f03f98f05f37
https://doi.org/10.1016/j.ijleo.2022.170438
https://doi.org/10.1016/j.ijleo.2022.170438
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Akademický článek
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Publikováno v:
Microprocessors and Microsystems. 77:103169
Main disputes of digital integrated circuits testing are increasing test data volume and test power. The proposed encoding schemes are a combination of nine coded and selective pattern compression, Alternate Variable Run length code to reduce test da
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b77016d30c3c52a2bbba279ac030bec
https://doi.org/10.1016/j.micpro.2020.103169
https://doi.org/10.1016/j.micpro.2020.103169
The fault tolerant system plays a crucial role in the critical applications which are being used in the present scenario. A fault may change the functionality of circuits. Aim of this paper is to design multiplier using fault tolerant hybrid full add
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1fd9150c9011b62f8941f2f3c5e7dfbc
Autor:
C. Kalamani, K. Paramasivam
Test data compression is an efficient method for reducing the test application cost. The problem of reducing test data has been addressed by researchers in three different aspects: Test Data Compression, Built-in-Self-Test (BIST) and Test set compact
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::26163de14fc20edbb298c15e2631604a