Removing multiple outliers and single-crystal artefacts from X-ray diffraction computed tomography data

Autor: Simon D. M. Jacques, Vesna Middelkoop, Robert J. Cernik, Marco Di Michiel, Antonios Vamvakeros, C. K. Egan, Andrew M. Beale

Publikováno v: Journal of Applied Crystallography. 48:1943-1955

This paper reports a simple but effective filtering approach to deal with single-crystal artefacts in X-ray diffraction computed tomography (XRD-CT). In XRD-CT, large crystallites can produce spots on top of the powder diffraction rings, which, after

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2a853563dba9323ea6401c3a9f597eec
https://doi.org/10.1107/s1600576715020701

Material specific X-ray imaging using an energy-dispersive pixel detector

Autor: Matthew C. Veale, Matthew D. Wilson, C. K. Egan, Robert J. Cernik, Paul Seller, Simon D. M. Jacques

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 324:25-28

By imaging the X-ray spectral properties or ‘colours’ we have shown how material specific imaging can be performed. Using a pixelated energy-dispersive X-ray detector we record the absorbed and emitted hard X-radiation and measure the energy (col

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::919cc27c267607b205ba1021d0a5ae6c
https://doi.org/10.1016/j.nimb.2013.11.021

Multiple Module Pixellated CdTe Spectroscopic X-Ray Detector

Autor: Steven Bell, Paul J. Sellin, Silvia Pani, C Christodoulou, Matthew D. Wilson, Matthew C. Veale, Paul Seller, Robert J. Cernik, C. K. Egan, Simon D. M. Jacques, James Scuffham, Daniel O’Flynn, Robert D. Speller

Publikováno v: IEEE Transactions on Nuclear Science. 60:1197-1200

A pixellated CdTe detector system comprising 2×2 detector modules has been developed for high energy spectroscopic X-ray imaging applications and has an active area of 16 cm2 . The detector modules are made from the HEXITEC 80×80 ASIC and 1 mm thic

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::caa938c7a486da0cfa27400dab11a1ce
https://doi.org/10.1109/tns.2013.2240694

Energy calibration and gain correction of pixelated spectroscopic x-ray detectors using correlation optimised warping

Autor: Paul Seller, C. K. Egan, Matthew C. Veale, Matthew D. Wilson, Robert J. Cernik, James Scuffham

Publikováno v: Egan, C, Scuffham, J W, Veale, M C, Wilson, MD, Seller, P & Cernik, R 2016, ' Energy calibration and gain correction of pixelated spectroscopic x-ray detectors using correlation optimised warping ', Measurement Science and Technology . https://doi.org/10.1088/1361-6501/28/1/017001

We describe the implementation of a reliable, robust and flexible gain correction and energy calibration algorithm for pixelated spectroscopic x-ray detectors. This algorithm uses a data processing method known as correlation optimised warping which

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d806863084d20f487d62971ca5bb991c
https://www.research.manchester.ac.uk/portal/en/publications/energy-calibration-and-gain-correction-of-pixelated-spectroscopic-xray-detectors-using-correlation-optimised-warping(8fa4788d-0442-4a86-8db5-390e2f458c14).html

Characterisation of vapour grown CdZnTe crystals using synchrotron X-ray topography

Autor: A. Choubey, Moreton Moore, C. K. Egan, Robert J. Cernik

Publikováno v: Journal of Crystal Growth. 343:1-6

Synchrotron white beam X-ray topography has been used to characterise bulk crystal defects of thick vapour grown CdZnTe crystals. Whole 50 mm diameter wafers with thicknesses in the range of 2–3 mm were sliced from boules grown by the multi-tube ph

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::13242ed900fa836865b2f2823fa54504
https://doi.org/10.1016/j.jcrysgro.2012.01.003