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pro vyhledávání: '"C. K. Chua Tey"'
Autor:
T. Fei, S. H. Goh, Thomas Herrmann, G.F. You, T. Y. Lim, H. W. Ho, C. K. Chua Tey, B.L. Yeoh, Ran He, C. P. Yap, Y.H. Chan
Publikováno v:
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Conventional software scan diagnosis using Electronic Design Automation (EDA) tools and hardware diagnosis using frequency mapping technique, are established methodologies for broken scan chains fault isolation. This work proposes a diagnostic workfl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0e409c62d1e33c984f7f0c90ea64dbb
https://doi.org/10.1109/ipfa.2012.6306256
https://doi.org/10.1109/ipfa.2012.6306256
