Zobrazeno 1 - 8
of 8
pro vyhledávání: '"C. J. D. Catto"'
Publikováno v:
Journal of Microscopy. 119:19-28
SUMMARY Thin films of amorphous carbon, silicon and germanium have been examined at high resolution at accelerating voltages up to 575 kV with the Cambridge University high resolution electron microscope. The directly interpretable resolution has bee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a1c3080fc3eb8a35d31051b7531726a
https://doi.org/10.1111/j.1365-2818.1980.tb04072.x
https://doi.org/10.1111/j.1365-2818.1980.tb04072.x
Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope
Autor:
R. A. Camps, W. O. Saxton, L. A. Freeman, J. R. A. Cleaver, A.E. Timbs, David J. Smith, C. J. D. Catto, W. C. Nixon, V. E. Cosslett, H. Ahmed, K.C.A. Smith
Publikováno v:
Ultramicroscopy. 9:203-213
The Cambridge University 600 kV high resolution electron microscope is currently operating with a directly interpretable image resolution of close to 2 A. Following a brief outline of salient features of this HREM which have proven crucial to optimis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b0909f4951cbc95d9db5a7739b9f92d
https://doi.org/10.1016/0304-3991(82)90201-7
https://doi.org/10.1016/0304-3991(82)90201-7
Publikováno v:
Journal of Physics E: Scientific Instruments. 15:1351-1355
Measurements of the brightness and the electron energy distribution for high-performance electron guns for electron-optical instruments must take account of the small effective size of the electron source and the directional dependence of the emissio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::032734a6f534dea5094094d99ca5dfdb
https://doi.org/10.1088/0022-3735/15/12/020
https://doi.org/10.1088/0022-3735/15/12/020
Autor:
K. C. A. Smith, C. J. D. Catto
Publikováno v:
Journal of Microscopy. 98:417-435
SUMMARY An approximate theory is developed for estimating the limiting topographical resolution of the scanning electron microscope operating under certain idealized conditions. Limitations imposed by electron beam shot noise and electron diffusion e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2851de867d8a656747a74aaf3955b26e
https://doi.org/10.1111/j.1365-2818.1973.tb03844.x
https://doi.org/10.1111/j.1365-2818.1973.tb03844.x
Autor:
David J. Smith, C. J. D. Catto, W. O. Saxton, W. C. Nixon, K. C. A. Smith, J. R. A. Cleaver, A.E. Timbs, R. A. Camps, P. W. Turner, P. M. Ross, Haroon Ahmed, V. E. Cosslett
Publikováno v:
Nature. 281:49-51
The resolution that may be achieved with an electron microscope can be improved by increasing the accelerating voltage, provided that the electrical and mechanical design is of a sufficiently high standard to realise the theoretical performance1,2. S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::729fd1ba9a97ed3b3554311ad2d567f3
https://doi.org/10.1038/281049a0
https://doi.org/10.1038/281049a0
Publikováno v:
Nature. 281:465-467
Under favourable circumstances, high resolution axial bright-field transmission electron micrographs can provide information on the medium-range structure of oxide glasses and amorphous semiconductors1. Specifically, the presence in an image of local
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf195e246fa72040c7af65c0d37d76b9
https://doi.org/10.1038/281465a0
https://doi.org/10.1038/281465a0
Autor:
J.R.A. Cleaver, W. C. Nixon, P. W. Turner, H. Ahmed, K.C.A. Smith, C. J. D. Catto, A.E. Timbs
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 36:10-11
1. Introduction.The Cambridge University 600 kV high resolution electron microscope has been developed as a joint programme between the Department of Engineering and the Department of Physics. The shorter electron wavelength at 600 kV when compared t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24a36dcdb7613bb3dc3cf43c08a7057e
https://doi.org/10.1017/s0424820100107198
https://doi.org/10.1017/s0424820100107198
Autor:
David J. Smith, C. J. D. Catto, J. R. A. Cleaver, David A. Jefferson, R. A. Camps, John Meurig Thomas
Publikováno v:
Nature. 281:51-52
Chemists and mineralogists often have to elucidate the crystal structure of new materials even when conventional X-ray methods are not applicable. If, for example, long-range order is not extensive or the amount of material available for examination
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be8c6696ef0133fb69c97620de3e28e3
https://doi.org/10.1038/281051a0
https://doi.org/10.1038/281051a0