Zobrazeno 1 - 10
of 36
pro vyhledávání: '"C. Hollerith"'
Akademický článek
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Autor:
D. Debie, Walter Mack, M. Graml, T. Schaffus, H. Pfaff, F. Kroninger, W. Breuer, M. Schaffus, Jürgen Walter, C. Hollerith, P. Albert
Publikováno v:
Microelectronics Reliability. :299-303
The given project is to benchmark typical preparation methods under the aspect of the influence of initial intrinsic stresses inside electronic components. Micro milling - and laser-decapsulation in combination with plasma etching were chosen as prep
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6af189f05085587c561a3ddd16918bfe
https://doi.org/10.1016/j.microrel.2018.07.093
https://doi.org/10.1016/j.microrel.2018.07.093
Publikováno v:
International Symposium for Testing and Failure Analysis.
GHz-SAM using toneburst transducers is a method currently lacking the possibility to measure warped samples easily because large parts of such samples are out of focus due to the limited depth of focus of these types of transducers. This paper shows
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fbf245b2616f8919a25c0637e1536292
https://doi.org/10.31399/asm.cp.istfa2019p0025
https://doi.org/10.31399/asm.cp.istfa2019p0025
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
D. Wernicke, J. Jochum, J. Höhne, B. Simmnacher, M. E. Huber, Kevin Phelan, Franz von Feilitzsch, M. Stark, C. Hollerith, M. Bühler, W. Westphal, W. Weiland, Theo Hertrich
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 520:606-609
Shrinking feature sizes in semiconductor device production as well as the use of new materials demand innovation in device technology and material analysis. X-ray spectrometers based on superconducting sensor technology are currently closing the gap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::043ef02cd3c1ff581931b46cc76467f3
https://doi.org/10.1016/j.nima.2003.11.327
https://doi.org/10.1016/j.nima.2003.11.327
Publikováno v:
Microelectronics Reliability. 43:1675-1680
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8f92dafa1df517e4d2aaaa5abb945dd
https://doi.org/10.1016/s0026-2714(03)00304-4
https://doi.org/10.1016/s0026-2714(03)00304-4
Autor:
C. Isaila, J. Höhne, Kevin Phelan, B. Simmnacher, R. Weiland, Franz von Feilitzsch, C. Hollerith, D. Wernicke
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 559:734-736
The combination of high-energy-resolution spectrometers with high-spatial-resolution scanning electron microscopes provides a powerful tool for material analysis. X-ray spectrometers based on superconducting transition edge sensors combine the advant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19353ffd5f19e6d28f195839ed8b700c
https://doi.org/10.1016/j.nima.2005.12.121
https://doi.org/10.1016/j.nima.2005.12.121
Autor:
Franz von Feilitzsch, A. Ruedig, J. Jochum, G. Angloher, W. Potzel, M. E. Huber, C. Hollerith
Publikováno v:
X-Ray Spectrometry. 33:253-255
Superconducting tunnel junctions (STJs) are a type of cryogenic detector with a working temperature of about 100 mK. They allow the combination of low energy threshold, high quantum efficiency and good count rate capability with an excellent energy r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d72918d7921253176abef10deb35de0b
https://doi.org/10.1002/xrs.715
https://doi.org/10.1002/xrs.715
Publikováno v:
International Symposium for Testing and Failure Analysis.
Microcalorimeter based energy dispersive X-ray analysis (EDS) combines in a revolutionary way resolution of wavelength dispersive spectroscopy (WDS) with the ease of use of conventional EDS. The necessary operating temperatures (~100mK) for the super
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c387a8bc4690bcb9c6981a208e6b808c
https://doi.org/10.31399/asm.cp.istfa2002p0087
https://doi.org/10.31399/asm.cp.istfa2002p0087
Autor:
J. Hohne, M. Buhler, F.V. Feilitzsch, J. Jochum, T. Hertrich, C. Hollerith, M. Huber, J. Nicolosi, K. Phelan, D. Redfern, B. Simmnacher, R. Weiland, D. Wernicke
Publikováno v:
Proceedings of the 5th European Workshop on Low Temperature Electronics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81e75c4263e917203bd0d9655404b348
https://doi.org/10.1109/wolte.2002.1022464
https://doi.org/10.1109/wolte.2002.1022464