Zobrazeno 1 - 1
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pro vyhledávání: '"C. G. Emms"'
Publikováno v:
IEEE Transactions on Nuclear Science. 21:159-166
Electrical measurements are described of grown silicon dioxide thin films irradiated by gamma rays, X-rays and broadband VUV light. The dependence of radiation-sensitivity on processing variations, including annealing temperature, is compared for uni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::492facbdbcca947d3df88ba7276e0364
https://doi.org/10.1109/tns.1974.6498922
https://doi.org/10.1109/tns.1974.6498922
