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pro vyhledávání: '"C. Ferranti"'
Akademický článek
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Autor:
M. R. Proto, E. Biondi, M. Levoni, C. Ferranti, M. Di Vito, L. Barbanti, M. Modesto, P. Mattarelli
The control of Erwinia amylovora (Ea), causal agent of bacterial fire blight, is one of the major challenges in pome fruit production. Nowadays, the main control strategy of this disease is based on the use of integrated methods: the infections are m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4094::1390be24ab2f7f800bc002a5a9c29e32
http://hdl.handle.net/11585/697962
http://hdl.handle.net/11585/697962
Akademický článek
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Autor:
Chris H. Park, David C. Ferranti, Brett B. Lewis, John A. Notte, Baohua Niu, Gregory M. Johnson, Ted Lundquist
Publikováno v:
International Symposium for Testing and Failure Analysis.
The examination of partially deprocessed ICs for well imaging has been investigated. First it has been shown [1] that Ga+ FIB imaging can readily and strongly highlight the N-well / P-well boundary in an IC as shown again here. Second, a model which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c866be629967e6264982ea8e9a8146ea
https://doi.org/10.31399/asm.cp.istfa2019p0192
https://doi.org/10.31399/asm.cp.istfa2019p0192
Akademický článek
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Autor:
Lewis Stern, Samuel M. Nicaise, Vitor R. Manfrinato, John A. Notte, Jeff Marshman, Donald Winston, Huigao Duan, Lin Lee Cheong, David C. Ferranti, Karl K. Berggren, Shawn McVey
Publikováno v:
Nano Letters. 11:4343-4347
Existing techniques for electron- and ion-beam lithography, routinely employed for nanoscale device fabrication and mask/mold prototyping, do not simultaneously achieve efficient (low fluence) exposure and high resolution. We report lithography using
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d86e32e20b0fa81f40ab27244fe6f153
https://doi.org/10.1021/nl202447n
https://doi.org/10.1021/nl202447n
Autor:
David C. Ferranti, Mark A.E. Jepson, Cornelia Rodenburg, David C. Bell, Beverley J. Inkson, X Liu
Publikováno v:
Microscopy and Microanalysis. 17:637-642
As the miniaturization of semiconductor devices continues, characterization of dopant distribution within the structures becomes increasingly challenging. One potential solution is the use of the secondary electron signal produced in scanning electro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ab91b77e221af3b6f131fe8f191952d
https://doi.org/10.1017/s1431927611000365
https://doi.org/10.1017/s1431927611000365
Autor:
C. Ferranti, N. Masciadri
Publikováno v:
Journal of Ultrasound. 14:55-65
Benign breast diseases constitute a heterogeneous group of lesions arising in the mammary epithelium or in other mammary tissues, and they may also be linked to vascular, inflammatory or traumatic pathologies. Most lesions found in women consulting a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0e884af0fe1150e9ef01866d0166f18e
https://doi.org/10.1016/j.jus.2011.03.002
https://doi.org/10.1016/j.jus.2011.03.002
Autor:
Gianna Tempera, Carlo Genovese, Sandro Ripa, Pio Maria Furneri, S. Ungheri, Giuseppe Nicoletti, C. Ferranti
Publikováno v:
International Journal of Immunopathology and Pharmacology. 23:833-840
Over the last twenty years there has been an alarming increase in isolation of Streptococcus pneumoniae strains with a reduced susceptibility not only to penicillin, but also to other betalactams and macrolides. This phenomenon justifies the great in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b44123a0579e7074446e80e47ab3acb1
https://doi.org/10.1177/039463201002300318
https://doi.org/10.1177/039463201002300318
Publikováno v:
Microscopy and Microanalysis. 21:1165-1166
The focused ion beam (FIB) is widely used in semiconductor industries for circuit editing (CE), failure analysis (FA) and nanofabrication. Gallium FIB is most developed for CE and FA for feature size >10 nm. In general, after the FIB processing, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a56d65fd1f77865b66da13ebffc1a7cb
https://doi.org/10.1017/s1431927615006613
https://doi.org/10.1017/s1431927615006613