Zobrazeno 1 - 10
of 23
pro vyhledávání: '"C. F. Brucker"'
Autor:
T. W. McDaniel, C. F. Brucker
Publikováno v:
MRS Proceedings. 674
We have carried out a combined experimental and computer simulation study to specify and identify candidate films to support high areal density, thermally-assisted magnetic recording. The motivation of this work is to utilize the enhanced writability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42cbfa37320bcaa2a934b5d5a799d929
https://doi.org/10.1557/proc-674-v2.3
https://doi.org/10.1557/proc-674-v2.3
Publikováno v:
Joint International Symposium on Optical Memory and Optical Data Storage.
MO technology is now widely used for erasable optical storage. Almost all MO media products to date are based on rare-earth/transition metal alloys (RE-TM), such as TbFeCo. Although these alloys provide excellent recording performance, their intrinsi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0956703361ac845500a69deb7efa062e
https://doi.org/10.1364/isom.1996.owd.7
https://doi.org/10.1364/isom.1996.owd.7
Autor:
C. F. Brucker, T. K. Hatwar
Publikováno v:
Journal of Applied Physics. 79:5704
Co/Pt superlattice films for magneto‐optical recording have a relatively high Curie temperature compared to rare earth‐transition metal films, which has led to criticism of their recording sensitivity at higher disk velocities. We have prepared h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a4f3506a4c8aa54d9a810af4b782b16
https://doi.org/10.1063/1.362224
https://doi.org/10.1063/1.362224
Publikováno v:
Journal of Applied Physics. 53:550-556
A new technique has been developed which directly measures carrier transport through the interfacial region at metal‐semiconductor (M‐S) contacts. The injection current is determined by measuring with fast time resolution the initial rate of deca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c94ce89f7d3e1517be476247d5f846f
https://doi.org/10.1063/1.329917
https://doi.org/10.1063/1.329917
Publikováno v:
Surface Science. 59:593-611
Photoemission spectra in the photon energy range 15 eV to 30 eV on clean Ir(100) show considerable dependence of spectral structure on photon energy. In addition, phtoionization cross-sections for the 4σ, 1π and 5σ levels of chemisorbed CO are str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f0acc0e73de46e7e3800f4f77cb1dc4
https://doi.org/10.1016/0039-6028(76)90038-8
https://doi.org/10.1016/0039-6028(76)90038-8
Publikováno v:
Journal of Vacuum Science and Technology. 17:894-898
We have created well‐defined concentrations of surface point defects (oxygen vacancies, Vos) on ZnO(1010) surfaces under controlled UHV conditions and have tested their influence on Schottky barrier formation. ZnO(1010) with and without surface def
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a146973e70a500b7a550515f477ad079
https://doi.org/10.1116/1.570612
https://doi.org/10.1116/1.570612
Atomic and electronic structure of InP–metal interfaces: A prototypical III–V compound semiconductor
Publikováno v:
Journal of Vacuum Science and Technology. 19:661-666
Soft x‐ray photoemission spectroscopy and electrical measurements of UHV‐cleaved InP–metal interfaces reveal that the interface abruptness on an atomic scale, the stoichiometry of semiconductor diffusion into the metal overlayer, and consequent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5aa589adeb067507cc5eb4415cf2c146
https://doi.org/10.1116/1.571081
https://doi.org/10.1116/1.571081
Publikováno v:
Physical Review B. 23:5576-5580
It is shown that anodic oxidation of graphite in ${\mathrm{H}}_{2}$S${\mathrm{O}}_{4}$ ultimately leads to creation of C-O covalent bonds which act as carrier scattering centers, degrading the metallic behavior of the intercalation compound. This eff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c545e09cdc8307e190b6cec91976fa4
https://doi.org/10.1103/physrevb.23.5576
https://doi.org/10.1103/physrevb.23.5576
Publikováno v:
Chemical Reviews. 79:91-137
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e61c45d984b5e799ba56cab425fa25da
https://doi.org/10.1021/cr60318a001
https://doi.org/10.1021/cr60318a001
Publikováno v:
Journal of Vacuum Science and Technology. 20:701-704
The interdiffusion and chemical processes during the in situ (pressure in the 10−10 Torr range) deposition of Cu on cleaved CdS (1120) were investigated by soft‐x‐ray photoemission spectroscopy. The extreme surface sensitivity of this technique
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::798b664013ebbdde001f9e73098d2a11
https://doi.org/10.1116/1.571634
https://doi.org/10.1116/1.571634