Zobrazeno 1 - 10
of 23
pro vyhledávání: '"C. E. LYMAN"'
Publikováno v:
Particles in Gases and Liquids 2 ISBN: 9781489935465
Submicron particles are known to cause yield losses in the manufacture of electronic devices. Analytical electron microscopy (AEM) is a powerful tool for characterizing particles by size, morphology and composition. Data obtained can be used to ident
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8eb5ef039d8c1618c1b608e29b7b341e
https://doi.org/10.1007/978-1-4899-3544-1_21
https://doi.org/10.1007/978-1-4899-3544-1_21
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 53:404-405
Catalyst microstructure and catalytic properties can be directly correlated using a composition-size distribution diagram that maps the phases of small alloy particles by composition and size. The application of this diagram given here concerns Pt-Rh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8a79553ac441e7c119159ed97749f97
https://doi.org/10.1017/s0424820100138397
https://doi.org/10.1017/s0424820100138397
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 52:780-781
Alumina-supported Pt-Rh alloy catalysts are widely utilized for air pollution control and are particularly effective for the reduction of nitric oxide (NO) at temperatures below 300°C. The alloy particles of interest are present in the size range of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fedabac8b267705d05e91caa897957f1
https://doi.org/10.1017/s0424820100171638
https://doi.org/10.1017/s0424820100171638
Autor:
C. E. Lyman
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 52:956-957
The advantages of analytical electron microscopy (AEM) at accelerating voltages of 200 kV and above have been discussed for years. However, the practical realization of significant improvements in spatial resolution, elemental detectability, and quan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54b4c47a5c81147f67892bd613b6bbfa
https://doi.org/10.1017/s0424820100172516
https://doi.org/10.1017/s0424820100172516
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 51:838-839
Imaging and analysis of heterophase interfaces in cross-sectional view requires demanding thin specimen preparation techniques. The term heterophase refers to the juxtaposition of a heavy and a light element or a metal and an insulator on either side
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f9b0c4324bf7c8917b5166421702349
https://doi.org/10.1017/s0424820100150022
https://doi.org/10.1017/s0424820100150022
Autor:
D. W. Ackland, C. E. Lyman
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 49:720-721
Analytical electron microscopy (AEM) was well served by the original hole count test that prompted microscope manufacturers to reduce, by an order of magnitude, spurious x-ray generation in the specimen. This spurious x-ray signal is caused by hard x
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5b5599519da85f3feaf30d749029142
https://doi.org/10.1017/s0424820100087914
https://doi.org/10.1017/s0424820100087914
Autor:
C. E. Lyman
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 49:2-3
Imaging of elemental distributions on a fine scale is one of the triumphs of electron microscopy. Compositional imaging frees the operator from the necessity of making decisions about which features contain the elements of interest. Elements in unexp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1978cc6fca1db4137ce0bf6c4b9bec7d
https://doi.org/10.1017/s0424820100084314
https://doi.org/10.1017/s0424820100084314
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 48:450-451
The major advantage of performing x-ray microanalysis in the analytical electron microscope (AEM) is the high compositional spatial resolution and the chemical analysis sensitivity. The spatial resolution (R) is dependent on the size of the focused e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9f89e5fa2c843fdd4c02ccacc254905
https://doi.org/10.1017/s042482010013585x
https://doi.org/10.1017/s042482010013585x
Publikováno v:
CORROSION. 36:246-251
The most susceptible site for pit initiation was found by optical metallography and transmission electron microscopy to be the retained delta ferrite/austenite interface. Microanalysis results, which were obtained with scanning transmisssion electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4207acd98230137b5f50d5e6ed8b9588
https://doi.org/10.5006/0010-9312-36.5.246
https://doi.org/10.5006/0010-9312-36.5.246
Autor:
C. E. Lyman, J. B. Vander Sande
Publikováno v:
Metallurgical Transactions A. 7:1211-1216
The growth of spherical precipitates in an Al-5 wt pct Zn-2 wt pct Mg alloy was monitored by hardness measurements and transmission electron microscopy. The growth of precipitates from 15 to 80A in diameter was followed for various aging times at tem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::adbf6fd7427ca2c1432d312ae7c0f6a6
https://doi.org/10.1007/bf02656605
https://doi.org/10.1007/bf02656605