Zobrazeno 1 - 6
of 6
pro vyhledávání: '"C. E. FOERSTER"'
Publikováno v:
Revista da Faculdade de Odontologia de Porto Alegre, Vol 47, Iss 3 (2006)
Este trabalho estudou os efeitos da irradiação iônica sobre as propriedades mecânicas de três cerâmicas odontológicas: Omega 900 Vitadur Alpha e IPS Empress 2. Em uma primeira etapa, foi investigada a qualidade do acabamento superficial das ce
Externí odkaz:
https://doaj.org/article/2dff856dd9604fa1af7258007b9591a5
Autor:
Carlos Maurício Lepienski, F.C. Zawislak, Francisco C. Serbena, M Abbate, Wido H. Schreiner, C. E. Foerster, Irene Teresinha Santos Garcia
Publikováno v:
Thin Solid Films. 411:256-261
The nanoindentation technique was used to measure the hardness and Young's modulus of AZ-1350J™ photoresist films irradiated with argon (760 keV), nitrogen (760 keV) and helium (380 keV) with fluences ranging from 1×10 13 to 1×10 16 ions cm −2
Publikováno v:
Thin Solid Films. 340:201-204
The nanoindentation technique is used to measure the hardness and the Young’s modulus of ion irradiated C60 films, 70 nm thick, deposited on a Silicon substrate. An increase of hardness from 1.3 GPa for the pristine sample to 10 GPa after irradiati
Autor:
Francisco C. Serbena, F.C. Zawislak, C. E. Foerster, Lucia H. Mozzaquatro, Carlos Maurício Lepienski
Publikováno v:
Revista da Faculdade de Odontologia de Porto Alegre; v. 47, n. 3 (2006)
Revista da Faculdade de Odontologia de Porto Alegre, Vol 47, Iss 3 (2006)
Revista da Faculdade de Odontologia de Porto Alegre, Vol 47, Iss 3 (2006)
In this work were studied the ion irradiation effects on the mechanical properties of three dental ceramics: Omega 900, Vitadur Alpha e IPS Empress 2. Initially, it was investigated the quality of surface finishing for the three ceramics: Omega 900,
Autor:
C. E. Foerster, F. C. Zawislaka, J. A. H. da Jornada, Francisco C. Serbena, Dimitrios Samios, Irene Teresinha Santos Garcia, Carlos Maurício Lepienski
Publikováno v:
Scopus-Elsevier
We investigate the crosslinking process in ion irradiated AZ 1350J™ photoresist. The films were deposited on clean silicon wafers and irradiated with 380 keV He ions in the fluence range of 1013 to 1016 He.cm-2, corresponding to average deposited e
Autor:
C. E. Foerster, Carlos Maurício Lepienski, Francisco C. Serbena, F.C. Zawislak, João Marcelo Jordão Lopes
Publikováno v:
Scopus-Elsevier
The nanoindentation technique was used to determine the hardness and Young’s modulus of thin C60 films irradiated with N ions. The pristine film, with thickness of 170 nm, was grown on a Si (111) substrate, with an intermediary layer of SiO2 50nm t