Zobrazeno 1 - 10
of 24
pro vyhledávání: '"C. Dal Savio"'
Publikováno v:
Measurement Science and Technology. 18:328-333
The key element of a scanning force microscope (SFM) is the cantilever probe. Commonly, its deflection is measured using either an optical lever or interferometric methods. However, optical detection methods increase the complexity of the microscope
Publikováno v:
Applied Physics B. 84:317-322
Single self-assembled InAs quantum dots embedded in a In0.12Ga0.88As quantum well and emitting in the near infrared have been optically investigated. The dependence on the excitation power of the single quantum dot photoluminescence has been used to
Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures
Publikováno v:
Applied Physics A: Materials Science & Processing. 76:889-892
A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope (SNOM) and a dedicated spectrometer was realised. This setup allows investigations at various temperatures from room to liqu
Publikováno v:
Journal of Microscopy. 209:199-204
Summary A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope and a dedicated spectrometer was realized. The set-up allows the optical investigation of samples at temperatures fr
Publikováno v:
Precision Engineering. 26:199-203
A compact sensor head based on scanning force microscopy (SFM) using cantilever probes has been developed. The idea is to replace the microscope objective of a conventional optical microscope by this compact module and turn the optical microscope int
Autor:
Jean-Philippe Tetienne, Stanislas Rohart, Géraldine Dantelle, Piernicola Spinicelli, Loïc Rondin, C. Dal Savio, Jean-François Roch, Khaled Karrai, Vincent Jacques, André Thiaville
We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In additi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06dc71e270254856fd154c963e82eb57
http://arxiv.org/abs/1108.4438
http://arxiv.org/abs/1108.4438
Publikováno v:
Journal of microscopy. 209(Pt 3)
A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope and a dedicated spectrometer was realized. The set-up allows the optical investigation of samples at temperatures from 10 to
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Publikováno v:
Review of Scientific Instruments. 77:043704
The frequency response of an atomic force microscope silicon cantilever located in a vacuum cryostat chamber was investigated. The resonance frequency and the peak width were extracted by a Lorentzian fit of the resonance curves for different sample
Akademický článek
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