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pro vyhledávání: '"C. Bodefeld"'
Publikováno v:
2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.01CH37263).
A new method to optically examine surface acoustic wave (SAW) propagation on a semiconductor chip is presented. This visualization method is based on the influence of a SAW on the optical properties of a piezoelectric semiconductor. There are two int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5d6784c1a5008ebfcd01cc560d2bb54
https://doi.org/10.1109/ultsym.2001.991596
https://doi.org/10.1109/ultsym.2001.991596
