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pro vyhledávání: '"C. B. Prater"'
Publikováno v:
Physical Review B. 42:9255-9258
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) images of 1T-${\mathrm{TaSe}}_{2}$ and 1T-${\mathrm{TaS}}_{2}$ at room temperature reveal both atoms and charge-density waves (CDW's). In AFM the atoms and CDW's have comparable am
Autor:
C. B. Prater
Publikováno v:
Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 9781475793246
The atomic force microscope is expanding its capabilities through the use of vibrating probe (AC) techniques. One mode of operation, called Tapping ModeTM oscillates the probe so that it lightly “taps” on the surface at the bottom of each oscilla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bf3a0092abbb4930edd26f23e1dc976
https://doi.org/10.1007/978-1-4757-9322-2_44
https://doi.org/10.1007/978-1-4757-9322-2_44
Publikováno v:
Microscopy Today. 3:14-15
Lateral Force Microscopy (LFU) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. It is one of several techniques developed as extensions to the basic topographical mapp
Autor:
C. B. Prater
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 53:716-717
The Atomic Force Microscope (AFM) has been widely used in the physics, chemistry, and materials science communities, and is becoming more common in life sciences research. To better serve the biological community, new instruments have been developed
Publikováno v:
Nature. 345:839-840