Zobrazeno 1 - 10
of 134
pro vyhledávání: '"C Thomas Harris"'
Autor:
Lucy L. Hale, Zhengtianye Wang, C. Thomas Harris, Igal Brener, Stephanie Law, Oleg Mitrofanov
Publikováno v:
APL Photonics, Vol 8, Iss 5, Pp 051304-051304-7 (2023)
Plasmons supported in the massless electron surface states of topological insulators (TIs), known as Dirac plasmons, have great potential in next generation optoelectronics. However, their inherent confinement to the surface makes the investigation o
Externí odkaz:
https://doaj.org/article/2c3bde9bfb0041b290ef390c5d6dd600
Autor:
Hyunseung Jung, Lucy L. Hale, Sylvain D. Gennaro, Jayson Briscoe, Prasad P. Iyer, Chloe F. Doiron, C. Thomas Harris, Ting Shan Luk, Sadhvikas J. Addamane, John L. Reno, Igal Brener, Oleg Mitrofanov
Publikováno v:
Nano Letters. 22:9077-9083
The effect of terahertz (THz) pulse generation has revolutionized broadband coherent spectroscopy and imaging at THz frequencies. However, THz pulses typically lack spatial structure, whereas structured beams are becoming essential for advanced spect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2f4056005230932746851d36b1ee0d8a
https://doi.org/10.1021/acs.nanolett.2c03456
https://doi.org/10.1021/acs.nanolett.2c03456
Autor:
Lucy L. Hale, Hyunseung Jung, Sylvain D. Gennaro, Jayson Briscoe, C. Thomas Harris, Ting Shan Luk, Sadhvikas J. Addamane, John L. Reno, Igal Brener, Oleg Mitrofanov
Publikováno v:
ACS Photonics. 9:1136-1142
Ultrafast optical excitation of select materials gives rise to the generation of broadband terahertz (THz) pulses. This effect has enabled the field of THz time-domain spectroscopy and led to the discovery of many physical mechanisms behind THz gener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a18ce85e1b37d1dd9fc02b0133f2b77e
https://doi.org/10.1021/acsphotonics.1c01908
https://doi.org/10.1021/acsphotonics.1c01908
Autor:
Lucy L. Hale, Hyunseung Jung, Sylvain D. Gennaro, Jayson Briscoe, C. Thomas Harris, Ting Shan Luk, Sadhvikas J. Addamane, John L. Reno, Igal Brener, Oleg Mitrofanov
Publikováno v:
2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9b7422a44052be1d8505312a8c39957
https://doi.org/10.1109/irmmw-thz50927.2022.9895778
https://doi.org/10.1109/irmmw-thz50927.2022.9895778
Autor:
Collin J. Delker, Raegan L. Johnson-Wilke, Otis M. Solomon, C. Thomas Harris, Ricky L. Sandoval, Sarah R. Stevenson, Christopher D. Nordquist, Mark Harry Ballance
Publikováno v:
IEEE Microwave and Wireless Components Letters. 31:409-412
We report a single broadband on-wafer resistance calibration standard fabricated with a 15-nm-thick gold resistor on an alumina substrate. Because the resistor film is much smaller than the skin depth at microwave frequencies, this proposed standard
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::180ccf464052f383ced96dfc2e36acbc
https://doi.org/10.1109/lmwc.2021.3054577
https://doi.org/10.1109/lmwc.2021.3054577
Autor:
Md Abu Jafar Rasel, Ryan Schoell, Nahid Sultan Al-Mamun, Khalid Hattar, C Thomas Harris, Aman Haque, Douglas E Wolfe, Fan Ren, Stephen J Pearton
Publikováno v:
Journal of Physics D: Applied Physics. 56:305104
While radiation is known to degrade AlGaN/GaN high-electron-mobility transistors (HEMTs), the question remains on the extent of damage governed by the presence of an electrical field in the device. In this study, we induced displacement damage in HEM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0bc1f717f563067241058bfddf7b312
https://doi.org/10.1088/1361-6463/accfa7
https://doi.org/10.1088/1361-6463/accfa7
Autor:
Michael Titze, Heejun Byeon, Anthony Flores, Jacob Henshaw, C. Thomas Harris, Andrew M. Mounce, Edward S. Bielejec
Publikováno v:
Nano letters. 22(8)
An in situ counted ion implantation experiment improving the error on the number of ions required to form a single optically active silicon vacancy (SiV) defect in diamond 7-fold compared to timed implantation is presented. Traditional timed implanta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f8852f9d4bb113cebbed14227a4ea18
https://pubmed.ncbi.nlm.nih.gov/35426685
https://pubmed.ncbi.nlm.nih.gov/35426685
Autor:
Ting S. Luk, Guangping Xu, Willard Ross, John N. Nogan, Ethan A. Scott, Sergei Ivanov, Oana Niculescu, Oleg Mitrofanov, C. Thomas Harris
Publikováno v:
Applied Physics Letters. 121:234101
Ultrathin light absorbers present a viable route toward improving the specific detectivity and response time of microbolometers. However, for an ultrathin film to absorb light efficiently, the dielectric function of the film and its thickness must sa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e11dd0061267a63153312e4ac61bcc76
https://doi.org/10.1063/5.0123671
https://doi.org/10.1063/5.0123671
Autor:
Ethan A. Scott, Manish K. Singh, John P. Barber, Christina M. Rost, Sergei Ivanov, John Watt, Douglas Pete, Peter Sharma, Tzu-Ming Lu, C. Thomas Harris
Publikováno v:
Applied Physics Letters. 121:203505
Vanadium oxide films are widely employed as thermal detectors in uncooled infrared detection systems due to their high temperature coefficient of resistance near room temperature. One strategy toward maximizing detectivity and reducing the thermal ti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::127ee4ad5de83e14c3f82cf12cb1671a
https://doi.org/10.1063/5.0123303
https://doi.org/10.1063/5.0123303
Autor:
Tzu-Ming Lu, C. Thomas Harris
Publikováno v:
The Review of scientific instruments. 92(5)
Resistance thermometry is a widely employed technique for general-purpose temperature measurements, with applications ranging from basic thermal physics experiments to industrial use in the automotive, aerospace, and microelectronics industries. Plat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2be55dad42b917db838cdccfdb0bdc8d
https://pubmed.ncbi.nlm.nih.gov/34243230
https://pubmed.ncbi.nlm.nih.gov/34243230