Zobrazeno 1 - 10
of 764
pro vyhledávání: '"C T, Koch"'
Autor:
Mhaka, Simbarashe1 smhaka78@gmail.com, Taonezvi, Lovemore2 ascendacademic@gmail.com
Publikováno v:
Managing Global Transitions: International Research Journal. Fall2024, Vol. 22 Issue 3, p201-229. 29p.
Autor:
Riabinin, Andrei1 (AUTHOR) andrey951233@mail.ru, Pankratova, Maria1 (AUTHOR), Rogovaya, Olga1 (AUTHOR), Vorotelyak, Ekaterina1 (AUTHOR), Terskikh, Vasiliy1 (AUTHOR), Vasiliev, Andrey1 (AUTHOR), Sheng, Yue1 (AUTHOR) shengyue@csu.edu.cn
Publikováno v:
BioMed Research International. 8/16/2024, Vol. 2024, p1-21. 21p.
Autor:
Ding, Degong1 (AUTHOR), Yao, Yuxin1 (AUTHOR), Hang, Pengjie1 (AUTHOR) hangpengjie@zju.edu.cn, Kan, Chenxia1 (AUTHOR), Lv, Xiang1 (AUTHOR), Ma, Xiaoming2 (AUTHOR), Li, Biao1 (AUTHOR), Jin, Chuanhong1 (AUTHOR), Yang, Deren1 (AUTHOR), Yu, Xuegong3 (AUTHOR) yuxuegong@zju.edu.cn
Publikováno v:
Advanced Science. 8/7/2024, Vol. 11 Issue 29, p1-10. 10p.
Autor:
C. T. Koch
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Recent advances in the development of electron optics have pushed the available information limit in high resolution electron microscopy (HRTEM) and scanning transmission electron microscopy (STEM) well beyond the 1A boundary. With increasing resolut
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5273cf9e37baac33ca4af99d32b633cd
https://doi.org/10.1007/978-3-540-85156-1_47
https://doi.org/10.1007/978-3-540-85156-1_47
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
The phase of an electron wave passing through a specimen can only be measured by interfering it with an external reference wave (off-axis holography) or itself (inline holography). Some of the advantages of inline holography over off-axis holography
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ff590b200d13e335a3d8ffc4f39e464
https://doi.org/10.1007/978-3-540-85226-1_132
https://doi.org/10.1007/978-3-540-85226-1_132
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
Co-based alloys are used in numerous commercial applications because of their excellent performance under severe environments, which require high-temperature strength, corrosion resistance, wear resistance, etc. In general, these alloys belong to a m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e0aa2b416c29b57ae7b938b19fc81ba
https://doi.org/10.1007/978-3-540-85226-1_224
https://doi.org/10.1007/978-3-540-85226-1_224
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61ba00111da3c86d5726cb60fc0cbb7c
https://doi.org/10.1007/978-3-540-85156-1_191
https://doi.org/10.1007/978-3-540-85156-1_191
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
Rare earth-doped ceria counts as a significant ionic conductor that can be used as electrolyte in solid oxide fuel cells [1]. However, the significant electronic conductivity still represents the main limitation for this kind of applications. Electro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b19c997796306dbe0d5dd2333345980
https://doi.org/10.1007/978-3-540-85226-1_283
https://doi.org/10.1007/978-3-540-85226-1_283
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::165ac8a27e10aa1fa7aff874a1c10da1
https://doi.org/10.1007/978-3-540-85156-1_132
https://doi.org/10.1007/978-3-540-85156-1_132